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Proceedings : International Test Conference 2004 / [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

資料種別:
図書
出版情報:
Washington, D.C. : International Test Conference, c2004
形態:
xvi, 1459 p. ; 28 cm
著者名:
ISBN:
9780780385801 [0780385802]
書誌ID:
BA70122684
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