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Proceedings : 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 10-13 October 2004, Cannes, France / [edited by R. Aitken, ... [et al.] ] ; sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing (TCFTC), IEEE Computer Society Test Technology Technical Council (TTTC)

資料種別:
図書
出版情報:
Los Alamitos, Calif. : IEEE Computer Society, c2004
形態:
xii, 506 p. ; 23 cm
著者名:
ISBN:
9780769522418 [0769522416]
書誌ID:
BA70206296
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