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2005 IEEE International Reliability Physics Symposium proceedings : 43nd [i.e. 43rd] annual, San Jose, California, April 17-21, 2005 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

資料種別:
図書
出版情報:
[Piscataway, N.J.] : Institute of Electrical and Electronics Engineers, c2005
形態:
xii, 764 p. ; 28 cm
著者名:
ISBN:
9780780388031 [0780388038] (: soft.)
書誌ID:
BA7277267X
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