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2004 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Conference Center, S. Lake Tahoe, California, October 18-21, 2004 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

資料種別:
図書
出版情報:
[Piscataway, N.J.] : The Electron Devices Society and the Reliability Society of the Institute of Electrical and Electronics Engineers, c2004
形態:
vi, 222 p. ; 28 cm
著者名:
ISBN:
9780780385177 [0780385179] (: softbound)
書誌ID:
BA73262260
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