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DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 October, 2005, Monterey, California, USA / edited by Robert Aitken ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)

資料種別:
図書
出版情報:
Los Alamitos, Calif. : IEEE Computer Society, c2005
形態:
xii, 602 p. ; 23 cm
著者名:
ISBN:
9780769524641 [0769524648]
書誌ID:
BA74546795
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