DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 October, 2005, Monterey, California, USA | 東京工業大学附属図書館蔵書検索

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DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 October, 2005, Monterey, California, USA / edited by Robert Aitken ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)

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図書

出版情報:

Los Alamitos, Calif. : IEEE Computer Society, c2005

形態:

xii, 602 p. ; 23 cm

著者名:

ISBN:

9780769524641 [0769524648]

書誌ID:

BA74546795

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書誌詳細

その他の標題:	International Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems
注記:	"IEEE Computer Society Order Number P2464"--T.p. verso Includes bibliographical references and author index
主題:	Fault-tolerant computing--Congresses; Integrated circuits--Very large scale integration--Design and construction--Congresses
言語:	英語

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