Twenty first annual IEEE Semiconductor Thermal Measurement and Management Symposium, March 15-17, 2005, Fairmont Hotel, San Jose, CA USA | 東京工業大学附属図書館蔵書検索

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Twenty first annual IEEE Semiconductor Thermal Measurement and Management Symposium, March 15-17, 2005, Fairmont Hotel, San Jose, CA USA / [sponsored by] IEEE Components, Packaging and Manufacturing Technology Society

資料種別:

図書

出版情報:

Piscataway, N.J. : IEEE Service Center, c2005

形態:

xvii, 360 p. ; 28 cm

著者名:

ISBN:

9780780389854 [0780389859] (: softbound)

書誌ID:

BA75468154

子書誌情報

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書誌詳細

その他の標題:	Proceedings 2005 : twenty first IEEE Semiconductor Thermal Measurement and Management Symposium
ISSN:	10652221
注記:	"IEEE catalog number 05CH37651" -- T.p. verso "The 2005 Semiconductor Thermal Measurement and Management (SEMI-THERM) Symposium is an annual international forum" -- T.p. Includes bibliographical references
言語:	英語

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