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Twenty first annual IEEE Semiconductor Thermal Measurement and Management Symposium, March 15-17, 2005, Fairmont Hotel, San Jose, CA USA / [sponsored by] IEEE Components, Packaging and Manufacturing Technology Society

資料種別:
図書
出版情報:
Piscataway, N.J. : IEEE Service Center, c2005
形態:
xvii, 360 p. ; 28 cm
著者名:
ISBN:
9780780389854 [0780389859] (: softbound)
書誌ID:
BA75468154
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