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Technologies for synthetic environments : hardware-in-the-loop testing V : 24-26 April 2000, Orlando, [Florida] USA / Robert Lee Murrer, Jr., chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2000
形態:
ix, 410 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4027 <BA0022700X>
著者名:
ISBN:
9780819436535 [0819436534]
書誌ID:
BA76035662
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