Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA | 東京工業大学附属図書館蔵書検索

>> Google Books

所蔵情報QRコード

Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA / Lahsen Assoufid, Peter Z. Takacs, John S. Taylor, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c2005

形態:

1 v. (various pagings) ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5921 <BA0022700X>

著者名:

ISBN:

9780819459268 [0819459267]

書誌ID:

BA77243508

子書誌情報

フルテキスト

Loading contents information

所蔵情報

Loading availability information

他の版・巻

書誌詳細

ISSN:	0277786X
注記:	Includes bibliographical references and author index
主題:	Laser interferometers--Congresses; Measuring instruments--Design and construction--Congresses; Mensuration--Congresses; Optical instruments--Design and construction--Congresses; Optical measurements--Congresses
言語:	英語

東工大ブックレビュー

Loading review information

類似資料:

1 図書 Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA Assoufid, Lahsen, Takacs, Peter Z., Ohtsuka, Masaru, Society of Photo-optical Instrumentation Engineers SPIE	7 図書 Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California (: pt. 1 ; : pt. 2) Grover, C. P., Society of Photo-optical Instrumentation Engineers, International Symposium on Optical and Optoelectronic … SPIE
2 図書 Recent developments in traceable dimensional measurements III : 31 July-1 August, 2005, San Diego, California (pbk.) Decker, Jennifer E., Peng, Gwo-Sheng, Society of Photo-optical Instrumentation Engineers SPIE	8 図書 Recent developments in optical gauge block metrology : 20-21 July 1998, San Diego, California Decker, Jennifer E., Brown, Nicholas, Society of Photo-optical Instrumentation Engineers SPIE
3 図書 Recent developments in traceable dimensional measurements II : 4-6 August, 2003, San Diego, California, USA Decker, Jennifer E., Brown, Nicholas, Society of Photo-optical Instrumentation Engineers SPIE	9 図書 Advances in fabrication and metrology for optics and large optics : 17-19 August 1988, San Diego, California Arnold, J. B. (Jones Beasley), 1945-, Parks, R. E. (Robert Eugene), 1948-, Society of Photo-optical Instrumentation … The Society
4 電子ブック Advances in Metrology for X-Ray and EUV Optics Assoufid, Assoufid, Lahsen, Takacs, Peter Z., Taylor, John S., Society of Photo-optical Instrumentation Engineers. SPIE Digital Library Proceedings	10 電子ブック Advances in Metrology for X-Ray and EUV Optics VI Assoufid SPIE Digital Library Proceedings, SPIE
5 電子ブック Advances in Metrology for X-Ray and EUV Optics II Assoufid, Assoufid, Lahsen, Ohtsuka, Masaru, Takacs, Peter Z., Society of Photo-optical Instrumentation Engineers. SPIE Digital Library Proceedings	11 電子ブック Advances in Metrology for X-Ray and EUV Optics III Assoufid SPIE Digital Library Proceedings
6 図書 Recent developments in traceable dimensional measurements : 20-21 June 2001, Munich, Germany Decker, Jennifer E., Brown, Nicholas, Society of Photo-optical Instrumentation Engineers, European Optical Society, … SPIE	12 電子ブック Advances in Metrology for X-Ray and EUV Optics IV Assoufid SPIE Digital Library Proceedings, SPIE

1

2

3

4

5

6

7

8

9

10

11

12