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2005 International Conference on Simulation of Semiconductor Processes and Devices : SISPAD 2005 : September 1-3, 2005, Komaba Eminence, Tokyo, Japan / co-sponsored by Japan Society of Applied Physics, IEEE Electron Devices Society ; in cooperation with the Institute of Electronics, Information and Communication Engineers, IEEE EDS Japan Chapter, IEEE EDS Kansai Chapter

資料種別:
図書
出版情報:
[Tokyo] : Japan Society of Applied Phyisics
Piscataway, N.J. : IEEE, c2005
形態:
xv, 340 p. ; 28 cm
著者名:
International Conference on Simulation of Semiconductor Devices and Processes <DA02627989>
応用物理学会 <DA00633233>
IEEE Electron Devices Society <DA01257512>
電子情報通信学会 <DA01657532>
IEEE EDS Japan Chapter
IEEE EDS Kansai Chapter
さらに 1 件
ISBN:
9784990276201 [4990276205]
書誌ID:
BA78343042
子書誌情報
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