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Nondestructive detection and measurement for homeland security III : 7-9 March, 2005, San Diego, California, USA / Aaron A. Diaz ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2005
形態:
v, 172 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5769 <BA0022700X>
著者名:
ISBN:
9780819457509 [0819457507] (pbk.)
書誌ID:
BA79577898
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