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Nondestructive detection and measurement for homeland security : 4-5 March, 2003, San Diego, California, USA / Steven R. Doctor, Yoseph Bar-Cohen, A. Emin Aktan, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2003
形態:
viii, 146 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5048 <BA0022700X>
著者名:
ISBN:
9780819448538 [0819448532]
書誌ID:
BA79578493
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