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Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA / Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash., USA : SPIE, c2005

形態:

ix, 214 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5770 <BA0022700X>

著者名:

ISBN:

9780819457516 [0819457515]

書誌ID:

BA79578722

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書誌詳細

ISSN:	0277786X
注記:	Includes bibliographical references and index
主題:	Automatic data collection systems--Congresses; Detectors--Congresses; Nondestructive testing--Congresses; Structural analysis (Engineering)--Congresses
言語:	英語

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