Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA / Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
- 資料種別:
- 図書
- 出版情報:
- Bellingham, Wash., USA : SPIE, c2005
- 形態:
- ix, 214 p. ; 28 cm
- シリーズ名:
- Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5770 <BA0022700X>
- 著者名:
- ISBN:
- 9780819457516 [0819457515]
- 書誌ID:
- BA79578722
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Advanced Sensor Technologies for Nondestructive Evaluation and Structural Health Monitoring II
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