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Image quality and system performance III : 17-19 January, 2006, San Jose, California, USA / Luke C. Cui, Yoichi Miyake, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE
Springfield, Va. : IS&T, c2006
形態:
1 v. (various pagings) ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v.6059 <BA0022700X>
著者名:
ISBN:
9780819460998 [0819460990]
書誌ID:
BA81874852
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