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The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

資料種別:
図書
出版情報:
Silver Spring, MD : IEEE Computer Society Press, c1984
形態:
xxxi, 886 p. ; 28 cm
著者名:
ISBN:
9780818605482 [0818605480] (pbk.)
9780818645488 [0818645482] (microfiche)
9780818685484 [0818685484] (hard)
書誌ID:
BA82230414
子書誌情報
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