The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984

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The three faces of test : design, characterization, production : International Test Conference, 1984 proceedings, October 16, 17, 18, 1984 / sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

資料種別:

図書

出版情報:

Silver Spring, MD : IEEE Computer Society Press, c1984

形態:

xxxi, 886 p. ; 28 cm

著者名:

ISBN:

9780818605482 [0818605480] (pbk.)
9780818645488 [0818645482] (microfiche)
9780818685484 [0818685484] (hard)

書誌ID:

BA82230414

子書誌情報

フルテキスト

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他の版・巻

書誌詳細

その他の標題:	IEEE 1984 Test Conference
注記:	"IEEE catalog no. 84CH2084-2." "Computer Society order no. 548." Includes bibliographical references and index
主題:	Integrated circuits--Testing--Congresses; Semiconductors--Testing--Congresses
言語:	英語

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