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Refractometry : 16-20 May 1994, Warsaw, Poland / Maksymilian Pluta, Mariusz Szyjer, chairs/editors ; organized by SPIE Poland Chapter, Institute of Applied Optics, Warsaw (Poland) ; sponsored by SPIE--the International Society for Optical Engineering, State Committee for Scientific Research (Poland)

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE, c1995
形態:
xxii, 228 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; 2208 <BA0022700X>
著者名:
Pluta, Maksymilian <DA02721331>
Szyjer, Mariusz <DA09516239>
Society of Photo-optical Instrumentation Engineers. Poland Chapter <DA10045435>
Institute of Applied Optics (Poland)
Society of Photo-optical Instrumentation Engineers <DA00848546>
Komitet Badań Naukowych (Poland) <DA1397620X>
さらに 1 件
ISBN:
9780819417060 [0819417068]
書誌ID:
BA82866463
子書誌情報
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