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Automatic inspection and novel instrumentation : 25-26 June 1997, Singapore / Anthony Tung-Shuen Ho, Sreenivas Rao, Lee Ming Cheng, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, SPIE Singapore Chapter, [and] Institute of Physics Singapore ; cosponsored by SPIE Japan Chapter ... [et al.] ; cooperating organizations, Nanyang Technological University (Singapore) ... [et al.]

資料種別:
図書
出版情報:
Bellingham, Wash., USA : SPIE, c1997
形態:
vii, 170 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3185 <BA0022700X>
著者名:
Automatic inspection and novel instrumentation
Ho, Anthony Tung-Shuen
Rao, Sreenivas
Cheng, Lee Ming
Society of Photo-optical Instrumentation Engineers <DA00848546>
Society of Photo-optical Instrumentation Engineers. Singapore Chapter
Institute of Physics, Singapore <DA05500769>
さらに 2 件
ISBN:
9780819426123 [0819426121]
書誌ID:
BA85952302
子書誌情報
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