Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA | 東京工業大学附属図書館蔵書検索

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Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA / Angela Duparré, Bhanwar Singh, Zu-Han GU, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c2005

形態:

1 v. (various pagings) ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5878 <BA0022700X>

著者名:

ISBN:

9780819458834 [081945883X]

書誌ID:

BA85970610

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書誌詳細

注記:	Includes bibliographical references and author index
主題:	Nanotechnology--Congresses; Optical measurements--Congresses; Optoelectronic devices--Congresses; Optoelectronics--Congresses; Semiconductors--Characterization--Congresses; Thin films--Optical properties--Congresses
言語:	英語

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