>> Google Books
所蔵情報QRコード

ICO20 : MEMS, MOEMS, and NEMS : 21-26 August, 2005, Changchun, China / Masayoshi Esashi, Zhaoying Zhou, chairs/editors ; organized by ICO--International Commission for Optics ...[et al.] ; sponsored by AFOSR Asia Office ... [et al.] ; published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2006
形態:
1 v. (various pagings) ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6032 <BA0022700X>
著者名:
International Commission for Optics. Congress <DA08776926>
江刺, 正喜(1949-) <DA00404203>
Zhou, Zhaoying
International Commission for Optics <DA02592239>
United States. Air Force. Office of Scientific Research. Asia Office
Society of Photo-optical Instrumentation Engineers <DA00848546>
さらに 1 件
ISBN:
9780819460639 [081946063X]
書誌ID:
BA86026103
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information

類似資料:

International Commission for Optics. Congress, Lu, Wei, 1971-, Young, Jeff, International Commission for Optics, United …

SPIE

International Commission for Optics. Congress, Wyant, James C., Zhang, Xiangjun, International Commission for Optics, …

SPIE

Mariella, Raymond P., Society of Photo-optical Instrumentation Engineers, United States. Air Force. Office of Scientific …

SPIE

International Commission for Optics. Congress, Chen, Y. C., International Commission for Optics, United States. Air …

SPIE

International Commission for Optics. Congress, Bally, G. von (Gert), Luo, Qingming, International Commission for Optics, …

SPIE

International Commission for Optics. Congress, Uchida, Tatsuo, 1947-, Liu, Xu, Song, Hang, International Commission for …

SPIE

Bergman, Keren, Centre national de la recherche scientifique (France), Symposium on Design, Test, Integration and …

IEEE

International Conference on MEMS, NANO, and Smart Systems, Badawy, Wael, Moussa, Walied, 1968-, iCORE, IEEE Computer …

IEEE Computer Society

Motamedi, M. Edward, Göring, Rolf, Society of Photo-optical Instrumentation Engineers, Semiconductor Equipment and …

SPIE

Design, Test, Integration, and Packaging of MEMS/MOEMS (Conference), Courtois, B. (Bernard), Centre national de la …

SPIE

12 電子ブック ICO20: MEMS, MOEMS, and NEMS

SPIE Digital Library Proceedings

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12