Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA / Emile J. Knystautas, Wiley P. Kirk, Valerie Browning, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering
- 資料種別:
- 図書
- 出版情報:
- Bellingham, Wash., USA : SPIE, c2001
- 形態:
- ix, 192 p. ; 28 cm
- シリーズ名:
- Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4468 <BA0022700X>
- 著者名:
- ISBN:
- 9780819441829 [0819441821]
- 書誌ID:
- BA86049481
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