Flat panel display technology and display metrology II : 22-23 January 2001, San Jose, [California] USA | 東京科学大学図書館　蔵書検索（大岡山図書館、すずかけ台図書館）

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Flat panel display technology and display metrology II : 22-23 January 2001, San Jose, [California] USA / Edward F. Kelley, Tolis Voutsas, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c2001

形態:

ix, 290 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4295 <BA0022700X>

著者名:

ISBN:

9780819439734 [0819439738]

書誌ID:

BA86065524

子書誌情報

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書誌詳細

その他の標題:	Flat panel display technology and display metrology 2 Flat panel display technology and display metrology two
注記:	Includes bibliographical references and index
主題:	Information display systems--Congresses; Liquid crystal displays--Congresses; Optical measurements--Congresses
言語:	英語

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