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Flat panel display technology and display metrology II : 22-23 January 2001, San Jose, [California] USA / Edward F. Kelley, Tolis Voutsas, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2001
形態:
ix, 290 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4295 <BA0022700X>
著者名:
ISBN:
9780819439734 [0819439738]
書誌ID:
BA86065524
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