Preface |
Editors |
Contributors |
Authors |
Introduction / John C. Rivière ; Sverre MyhraChapter 1: |
Problem Solving: Strategy, Tactics, and Resources / Chapter 2: |
Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS) / Vaneica Y. Young ; Gar B. HoflundChapter 3: |
Ion Beam Techniques: Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) / Birgit Hagenhoff ; Reinhard Kersting ; Derk RadingChapter 4: |
Surface and Interface Analysis by Scanning Probe Microscopy / Chapter 5: |
Transmission Electron Microscopy: Instrumentation, Imaging Modes, and Analytical Attachments / John M. TitchmarshChapter 6: |
Synchrotron-Based Techniques / Andrea R. Gerson ; David J. Cookson ; Kevin C. PrinceChapter 7: |
Quantification of Surface and Near-Surface Composition by AES and XPS / Sven TougaardChapter 8: |
Structural and Analytical Methods for Surfaces and Interfaces: Transmission Electron Microscopy / Chapter 9: |
In-Depth Analysis/Profiling / François Reniers ; Craig R. TewellChapter 10: |
Characterization of Nanostructured Materials / Matthias Werner ; Alison Crossley ; Colin JohnstonChapter 11: |
Problem-Solving Methods in Tribology with Surface-Specific Techniques / Christophe Donnet ; Jean-Michel MartinChapter 12: |
Problem-Solving Methods in Metallurgy with Surface Analysis / R. K. WildChapter 13: |
Composites / Peter M. A. SherwoodChapter 14: |
Minerals, Ceramics, and Glasses / Roger St. C. Smart ; Zhaoming ZhangChapter 15: |
Catalyst Characterization / Wolfgang E. S. Unger ; Thomas GrossChapter 16: |
Surface Analysis of Biomaterials / Marek Jasieniak ; Daniel Graham ; Peter Kingshott ; Lara J. Gamble ; Hans J. GriesserChapter 17: |
Adhesion Science and Technology / John F. WattsChapter 18: |
Electron Spectroscopy in Corrosion Science / James E. CastleChapter 19: |
Index |
Preface |
Editors |
Contributors |
Authors |
Introduction / John C. Rivière ; Sverre MyhraChapter 1: |
Problem Solving: Strategy, Tactics, and Resources / Chapter 2: |