Amplitude modulation atomic force microscopy

>> Google Books

所蔵情報QRコード

Amplitude modulation atomic force microscopy / Ricardo García

資料種別:: 図書
出版情報:: Weinheim : Wiley-VCH-Verl, c2010
形態:: xiv, 179 p. ; 25 cm
著者名:: García, Ricardo
ISBN:: 9783527408344 [3527408347]
書誌ID:: BB03848306

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

注記:

Includes bibliographical references and index

主題:

電子顕微鏡

言語:

英語

目次情報:

Preface

Annotation List

Introduction / 1：

Historical Perspective / 1.1：

Evolution Periods and Milestones / 1.2：

Early Times 1987-1992 / 1.2.1：

Exploration and Expansion 1993-1999 / 1.2.2：

Cantilever Tip Dynamics 2000-2006 / 1.2.3：

Multifrequency AFM 2007 to Present / 1.2.4：

Tapping Mode or Amplitude Modulation Force Microscopy? / 1.3：

Other Dynamic APM Methods / 1.4：

Frequency Modulation AFM / 1.4.1：

Amplitude Modulation versus Frequency Modulation AFM / 1.4.2：

Instrumental and Conceptual Aspects / 2：

Amplitude Modulation AFM / 2.1：

Elements of an Amplitude Modulation AFM / 2.3：

Feedback Controller / 2.3.1：

Optical Beam Deflection / 2.3.2：

Other Detection Methods / 2.3.3：

Tip Sample Motion System / 2.3.4：

Imaging Acquisition and Display / 2.3.5：

Cantilever-Tip System / 2.4：

Cantilevers / 2.4.1：

Tips / 2.4.2：

Excitation of Cantilever-Tip Oscillations / 2.4.3：

Calibration Protocols / 2.5：

Optical Sensitivity / 2.5.1：

Calibration of the Cantilever Force Constant / 2.5.2：

Thermal Noise Method / 2.5.2.1：

Sader Method / 2.5.2.2：

Common Experimental Curves / 2.6：

Resonance Curves in Air and liquids / 2.6.1：

Amplitude and Phase Shift Distance Curves / 2.6.2：

Displacements and Distances / 2.7：

Tip-Surface Interaction Forces / 3：

Van der Waals Forces / 3.1：

Contact Mechanics Forces / 3.3：

Derjaguin-Muller-Toporov Model / 3.3.1：

Johnson-Kendall-Roberts Model / 3.3.2：

Capillary Force / 3.4：

Forces in Liquid / 3.5：

Electrostatic Double-Layer Force / 3.5.1：

Derjaguin-Landau-Verwey-Overbeek Forces / 3.5.2：

Solvation Forces / 3.5.3：

Other Forces in Aqueous Solutions / 3.5.4：

Electrostatic Forces / 3.6：

Nonconservative Forces / 3.7：

Net Tip-Surface Force / 3.8：

Tip-Surface Force for a Stiff Material with Surface Adhesion Hysteresis / 3.8.1：

Tip-Surface Force for a Viscoelastic Material / 3.8.2：

Theory of Amplitude Modulation AFM / 4：

Equation of Motion / 4.1：

The Point-Mass Model: Elemental Aspects / 4.3：

The Harmonic Oscillator / 4.3.1：

Dynamics of a Weakly Perturbed Harmonic Oscillator / 4.3.2：

The Point-Mass Model: Analytical Approximations / 4.4：

Perturbed Harmonic Oscillator / 4.4.1：

Wang Model / 4.4.2：

Virial Dissipation Method / 4.4.3：

Peak and Average Forces / 4.5：

Peak Forces / 4.5.1：

Average Forces / 4.5.2：

The Point-Mass Model: Numerical Solutions / 4.6：

Attractive and Repulsive Interaction Regimes / 4.6.1：

Driving the Cantilever Below Resonance / 4.6.2：

The Effective Model / 4.7：

Appendix: The Runge-Kutta Algorithm

Advanced Theory of Amplitude Modulation AFM / 5：

Q-Control / 5.1：

Nonlinear Dynamics / 5.3：

Continuous Cantilever Beam Model / 5.4：

One-Dimensional Model / 5.4.1：

Equivalence between Point-Mass and Continuous Models / 5.5：

Systems Theory Description / 5.6：

Force Reconstruction Methods: Force versus Distance / 5.7：

Lee-Jhe Method / 5.7.1：

Hölscher Method / 5.7.2：

Time-Resolved Force / 5.8：

Acceleration / 5.8.1：

Higher Harmonics Method / 5.8.2：

Direct Time-Resolved Force Measurements / 5.8.3：

Amplitude Modulation AFM in Liquid / 6：

Qualitative Aspects of the Cantilever Dynamics in Liquid / 6.1：

Dynamics Far from the Surface / 6.2.1：

Dynamics Close to the Surface / 6.2.2：

Interaction Forces in Liquid / 6.3：

Some Experimental and Conceptual Considerations / 6.4：

Theoretical Descriptions of Dynamic AFM in Liquid / 6.5：

Analytical Descriptions: Far from the Surface / 6.5.1：

Analytical and Numerical Descriptions in the Presence of Tip-Surface Forces / 6.5.2：

Semianalytical Models / 6.5.3：

Finite Element Simulations / 6.5.4：

Phase Imaging Atomic Force Microscopy / 7：

Theory of Phase Imaging AFM / 7.1：

Phase Imaging Atomic AFM: High Q / 7.3.1：

Phase Imaging AFM: Low Q / 7.3.2：

Energy Dissipation Measurements at the Nanoscale / 7.4：

Energy Dissipation and Observables / 7.4.1：

Identification of Energy Dissipation Processes / 7.4.2：

Atomic and Nanoscale Dissipation Processes / 7.4.3：

Resolution, Noise, and Sensitivity / 8：

Spatial Resolution / 8.1：

Vertical Resolution and Noise / 8.2.1：

Lateral Resolution / 8.2.2：

Image Distortion and Surface Reconstruction / 8.3：

Force-Induced Surface Deformations / 8.4：

Atomic, Molecular, and Subnanometer Lateral Resolution / 8.5：

True Resolution / 8.5.1：

High-Resolution Imaging of Isolated Molecules / 8.6：

Conditions for High-Resolution Imaging / 8.7：

Image Artifacts / 8.8：

Multifrequency Atomic Force Microscopy / 9：

Normal Modes and Harmonics / 9.1：

Generation of Higher Harmonics / 9.2.1：

Coupling Eigenmodes and Harmonics / 9.2.2：

Imaging Beyond the Fundamental Mode / 9.2.3：

Bimodal AFM / 9.3：

Intermodulation Frequencies / 9.3.1：

Mode-Synthesizing Atomic Force Microscopy / 9.4：

Torsional Harmonic AFM / 9.5：

Band Excitation / 9.6：

Beyond Topographic Imaging / 10：

Scattering Near Field Optical Microscopy / 10.1：

Topography and Recognition Imaging / 10.3：

Tip Functionalization / 10.3.1：

Nanofabrication by AFM / 10.4：

AFM Oxidation Nanolithography / 10.4.1：

Patterning and Devices / 10.4.2：

References

Index

Preface

Annotation List

Introduction / 1：

Historical Perspective / 1.1：

Evolution Periods and Milestones / 1.2：

Early Times 1987-1992 / 1.2.1：

続きを見る

ブックレビュー

類似資料:

1 電子ブック Amplitude modulation atomic force microscopy (: electronic bk) García, Ricardo Wiley Online Library	7 図書 Advances in scanning probe microscopy 櫻井, 利夫(1945-), 渡辺, 洋右 Springer
2 電子ブック Amplitude Modulation Atomic Force Microscopy Castro Garcâia, Ricardo, García, Ricardo Wiley Online Library - AutoHoldings Books, John Wiley & Sons, Inc.	8 図書 Transmission electron microscopy of metals Thomas, Gareth Wiley
3 図書 Noncontact atomic force microscopy ([v. 1] ; v. 2) 森田, 清三, Wiesendanger, R. (Roland), 1961-, Meyer, E. (Ernst), Giessibl, Franz J. Springer-Verlag	9 図書 Scanning probe microscopy in nanoscience and nanotechnology ([v. 1] ; v. 2 ; v. 3) Bhushan, Bharat Springer
4 図書 Surface roughness study by atomic force microscopy : surface roughness-practical example Md. Abu Sayeed, Ferdous, Zakia LAP Lambert Academic Publishing	10 図書 Scanning probe microscopy in industrial applications : nanomechanical characterization Yablon, Dalia G. John Wiley & Sons
5 図書 Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces (: pbk) Kaupp, G. (Gerd) Springer	11 図書 Scanning probe microscopies : from surface structure to nano-scale engineering Stefanis, A. De, Tomlinson, A. A. G. (Anthony A. G.) Trans Tech Publications
6 図書 Imaging and manipulation of adsorbates using dynamic force microscopy : proceedings from the AtMol Conference Series, Nottingham, UK, April 16-17, 2013 (: hardcover) Moriarty, Philip, Gauthier, S., Workshop on Imaging and manipulation of adsorbates using dynamic force microscopy Springer	12 図書 Atomic force microscopy/scanning tunneling microscopy 3 Cohen, Samuel H., Lightbody, Marcia L., Foundation for Advances in Medicine and Science, Symposium on Atomic … Kluwer Academic/Plenum