Ferroelectric-gate field effect transistor memories : device physics and applications / Byung-Eun Park ... [et al.], editors
- 資料種別:
- 図書
- 出版情報:
- Dordrecht : Springer, c2016
- 形態:
- xviii, 347 p. ; 25 cm
- シリーズ名:
- Topics in applied physics ; 131 <BA00371072>
- 著者名:
- ISBN:
- 9789402408393 [9402408398]
- 書誌ID:
- BB22187267
類似資料:
SPIE Digital Library Proceedings | |
Wiley-Interscience |
McGraw-Hill |
Wiley, Chapman & Hall, Toppan | |
McGraw-Hill |
Macdonald & Evans |
McGraw-Hill | |
SPIE Digital Library Proceedings |