Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany

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Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany / Wolfgang Osten, Christophe Gorecki, Erik L. Novak, editors ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society, WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c2007

形態:

1 v. (various pagings) ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6616 <BA0022700X>

著者名:

Optical Measurement Systems for Industrial Inspection

Osten, Wolfgang

Gorecki, Christophe

Novak, Erik L.

SPIE Europe <DA1538798X>

European Optical Society <DA09002606>

Wissenschaftliche Gesellschaft Lasertechnik

Society of Photo-optical Instrumentation Engineers <DA00848546>

さらに 3 件

書誌ID:

BC02904420

子書誌情報

フルテキスト

所蔵情報

他の版・巻

Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany (: pt. 2)
Wolfgang Osten, Christophe Gorecki, Erik L. Novak, editors ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society, WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany) , SPIE , c2007

書誌詳細

その他の標題:	Optical measurement systems for industrial inspection 5 Optical measurement systems for industrial inspection five
注記:	Includes bibliographical references and author index "Part One of Two Parts"--T.p.
主題:	Optical detectors--Industrial applications--Congresses; Optical instruments--Industrial applications--Congresses; Quality control--Optical methods--Congresses
言語:	英語

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