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Optical manufacturing and testing VII : 28-29 August 2007, San Diego, California, USA / James H. Burge, Oliver W. Faehnle, Ray Williamson, editors ; sponsored and published by SPIE

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2007
形態:
1 v. (various pagings) ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6671 <BA0022700X>
著者名:
ISBN:
9780819468192 [0819468193] (: pbk)
書誌ID:
BC03114092
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