Autotestcon '82, October 12-14 : "the keys to cost reduction" : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio | 東京工業大学附属図書館蔵書検索

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Autotestcon '82, October 12-14 : "the keys to cost reduction" : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio / sponsored by the Institute of Electrical and Electronics Engineers ... [et al.]

資料種別:

図書

出版情報:

New York, NY : Institute of Electrical and Electronics Engineers, c1982

形態:

ix, 590 p. ; 28 cm

著者名:

Autotestcon <DA03955611>

Institute of Electrical and Electronics Engineers <DA00739948>

Institute of Electrical and Electronics Engineers. Dayton Section <DA04965803>

IEEE Aerospace and Electronic Systems Society <DA02635965>

IEEE Instrumentation and Measurement Society <DA03955666>

American Institute of Aeronautics and Astronautics <DA00149467>

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書誌ID:

BC03605946

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書誌詳細

その他の標題:	IEEE 1982 Autotestcon 1982 IEEE International Automatic Testing Conference, Dayton, Ohio, October 12-14, 1982 82CH1786-3 82CH17863
注記:	"82CH1786-3"
主題:	Automatic checkout equipment--Congresses
言語:	英語

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