所蔵情報QRコード
Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California / Sharad Prasad, Hans-Dieter Hartmann, Tohru Tsujide, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, Solid State Technology ... [et al.]
- 資料種別:
- 図書
- 出版情報:
- Bellingham, Washington : SPIE, c1998
- 形態:
- vii, 240 p. ; 28 cm
- シリーズ名:
- Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3510 <BA0022700X>
- 著者名:
- ISBN:
- 9780819429698 [0819429694]
- 書誌ID:
- BC07259982
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