Testing, reliability, and applications of optoelectronic devices : 24-26 January, 2001, San Jose, [California] USA | 東京科学大学図書館　蔵書検索（大岡山図書館、すずかけ台図書館）

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Testing, reliability, and applications of optoelectronic devices : 24-26 January, 2001, San Jose, [California] USA / Aland K. Chin ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Washington : SPIE, c2001

形態:

xxxii, 246 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4285 <BA0022700X>

著者名:

ISBN:

9780819439635 [0819439630]

書誌ID:

BC07476197

子書誌情報

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書誌詳細

注記:	Includes bibliographic references and author index
主題:	Optoelectronic devices--Reliability--Congresses; Optoelectronic devices--Testing--Congresses
言語:	英語

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