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Recent developments in traceable dimensional measurements II : 4-6 August, 2003, San Diego, California, USA / Jennifer E. Decker, Nicholas Brown, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2003
形態:
xi, 478 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5190 <BA0022700X>
著者名:
ISBN:
9780819450630 [0819450634]
書誌ID:
BC07734598
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