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Optical diagnostics : 3-4 August, 2005, San Diego, California, USA / Leonard M. Hanssen, Patrick V. Farrell, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c2005

形態:

1 v. (various pagings) ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5880 <BA0022700X>

著者名:

ISBN:

9780819458858 [0819458856]

書誌ID:

BC08171151

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographical references and author index
主題:	Materials--Testing--Congresses; Optical measurements--Congresses; Reflectance--Congresses; Refractive index--Congresses
言語:	英語

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