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Optical security and counterfeit deterrence techniques V : 20-22 January 2004, San Jose, California, USA / Rudolf L. van Renesse, chair/editor ; sponsored ... IS & T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2004
形態:
ix, 440 p. ; 28 cm
シリーズ名:
Proceedings of Electronic Imaging Science and Technology <BA86017226>
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5310 <BA0022700X>
著者名:
ISBN:
9780819452139 [0819452130] (pbk.)
書誌ID:
BC08171399
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