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Mathematical methods in pattern and image analysis : 3-4 August, 2005, San Diego, California, USA / Jaakko T. Astola, Ioan Ťǎbus̨, Junior Barrera, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c2005

形態:

1 v. (various pagings) ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5916 <BA0022700X>

著者名:

ISBN:

9780819459213 [0819459216] (pbk.)

書誌ID:

BC08831024

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書誌詳細

注記:	Includes bibliographical references and author index
主題:	Image processing--Digital techniques--Congresses; Image processing--Mathematics--Congresses; Neural networks (Computer science)--Congresses; Nonlinear optics--Mathematics--Congresses; Pattern recognition systems--Mathematics--Congresses
言語:	英語

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