Optoelectronic measurement technology and applications : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China / Shenghua Ye, Guangjun Zhang, Jun Ni, editors ; sponsored by CIS--China Instrument and Control Society [and] SPIE ; cooperating organizations, Optoelectronic-Mechanic Technology and System Integration Chapter, CIS (China) ... [et al.] ; supporting organizations, China Association for Science and Technology ... [et al.]
- 資料種別:
- 図書
- 出版情報:
- Bellingham, Wash. : SPIE, c2009
- 形態:
- 1 v. (various pagings) ; 28 cm
- シリーズ名:
- Proceedings / SPIE -- the International Society for Optical Engineering ; v. 7160 <BA0022700X>
- 著者名:
- ISBN:
- 9780819474049 [0819474045]
- 書誌ID:
- BC15338530
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