Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, USA | 東京科学大学図書館　蔵書検索（大岡山図書館、すずかけ台図書館）

>> Google Books

所蔵情報QRコード

Testing, reliability, and application of micro- and nano-material systems : 3-5 March, 2003, San Diego, California, USA / Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; cosponsored by National Institute of Standards and Technology (USA) ... [et al.] ; cooperating organizations, Institute of Acostic Microscopy (USA) ... [et al.] ; published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c2003

形態:

ix, 276 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5045 <BA0022700X>

著者名:

Meyendorf, Norbert

Baaklini, George Y.

Michel, Bernd, 1949-

United States. National Institute of Standards and Technology <DA02985311>

Institute of Acoustic Microscopy (U.S.)

Society of Photo-optical Instrumentation Engineers <DA00848546>

さらに 1 件

ISBN:

9780819448507 [0819448508]

書誌ID:

BC1616995X

子書誌情報

フルテキスト

Loading contents information

所蔵情報

Loading availability information

他の版・巻

書誌詳細

その他の標題:	Testing, reliability, and application of micromaterial and nanomaterial systems
注記:	Includes bibliographical references and author index
主題:	Electrooptical devices--Materials--Testing--Congresses; Microelectromechanical systems--Testing--Congresses; Nanostructured materials--Testing--Congresses; Photonics--Materials--Testing--Congresses
言語:	英語

ブックレビュー

Loading review information

類似資料:

1 図書 Testing, reliability, and application of micro- and nano-material systems II : 15-17 March, 2004, San Diego, California, USA Meyendorf, Norbert, Baaklini, George Y., Michel, Bernd, 1949-, Society of Photo-optical Instrumentation Engineers SPIE	7 電子ブック Testing, Reliability, and Application of Micro- and Nano-Material Systems Meyendorf SPIE Digital Library Proceedings
2 図書 Testing, reliability, and application of micro- and nano-material systems IV : 28 February-2 March 2006, San Diego, California, USA (pbk.) Geer, Robert E., Society of Photo-optical Instrumentation Engineers, American Society of Mechanical Engineers, … SPIE	8 電子ブック Testing, Reliability, and Application of Micro- and Nano-Material Systems II Meyendorf SPIE Digital Library Proceedings
3 図書 Testing, reliability, and application of micro- and nano-material systems III : 8-10 March 2005, San Diego, California, USA (pbk.) Geer, Robert E., Society of Photo-optical Instrumentation Engineers SPIE	9 図書 Reliability, testing, and characterization of MEMS/MOEMS II : 27-29 January 2003, San Jose, California, USA Ramesham, Rajeshuni, Tanner, Danelle Mary, 1952-, Society of Photo-optical Instrumentation Engineers, Semiconductor … SPIE
4 図書 Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport Beach, USA Meyendorf, Norbert, Baaklini, George Y., Michel, Bernd, Society of Photo-optical Instrumentation Engineers SPIE	10 図書 Reliability, packaging, testing, and characterization of MEMS/MOEMS IV : 24-25 January 2005, San Jose, California, USA Tanner, Danelle Mary, 1952-, Ramesham, Rajeshuni, Society of Photo-optical Instrumentation Engineers, Semiconductor … SPIE
5 図書 Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA Meyendorf, Norbert, Baaklini, George Y., Michel, Bernd, 1949- SPIE	11 図書 Nondestructive evaluation of materials and composites II : 31 March-1 April 1998, San Antonio, Texas Doctor, S. R., Lebowitz, Carol A., Baaklini, George Y., Society of Photo-optical Instrumentation Engineers, United … SPIE
6 図書 Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA Meyendorf, Norbert, Baaklini, George Y., Michel, Bernd, 1949-, Society of Photo-optical Instrumentation Engineers SPIE	12 電子ブック Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems Meyendorf SPIE Digital Library Proceedings

1

2

3

4

5

6

7

8

9

10

11

12