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1.

図書
図書
1. Proposals for the generation and use of refrigeration in the 21st. Century : proceedings of meetings of: Commission: B2 - C2 - E2, (September 7-9, 1992) = Propositions pour la production et l'utilisation du froid au XXI e Siécle : compte rendu des réunions de la: Commission: B2 - C2 - E2
International Institute of Refrigeration. Commission B2 ; International Institute of Refrigeration. Commission C2 ; International Institute of Refrigeration. Commission E2
出版情報: Buenos Aires : Its Organizing Committee, 1992  364 p. ; 25 cm
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2.

図書
図書
2. The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface
editors, Hisham Z. Massoud, Edward H. Poindexter, C. Robert Helms
出版情報: Pennington, NJ : Electrochemical Society, c1996  xv, 780 p. ; 27 cm
シリーズ名: Proceedings / [Electrochemical Society] ; v. 96-1
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3.

図書
図書
3. Programming concepts, methods and calculi : proceedings of the IFIP TC2/WG2.1/WG2.2/WG2.3 Working Conference on Programming Concepts, Methods, and Calculi (PROCOMET '94), San Miniato, Italy, 6-10 June 1994
edited by Ernst-Rüdiger Olderog
出版情報: Amsterdam ; New York : Elsevier, 1994  x, 592 p. ; 23 cm
シリーズ名: IFIP transactions ; A . Computer science and technology ; 56
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4.

図書
図書
4. Progrès dans la science et la technique en industrie alimentaire : compte rendu des réunions des: Commissions B2, C2, D1, D2/3 (September 24-28, 1990) = Progress in the science and technology of refrigeration in food engineering : proceedings of meetings of: Commissions B2, C2, D1, D2/3
International Institute of Refrigeration
出版情報: Paris, France : Institut international du froid (International Institute of Refrigeration), 1990  871 p. ; 24 cm
シリーズ名: Science et technique du froid = Refrigeration science and technology ; 1990-4
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5.

図書
図書
5. Le froid et la qualité des légumes frais : compte rendu de la réunion des Commissions C2, D2/3 = Refrigeration and the quality of fresh vegetables : proceedings of the meetings of Commissions C2, D2/3
édité par Institut international du froid = issued for International Institute of Refrigeration
出版情報: Paris, France : Institut International du Froid, [1994]  372 p. ; 24 cm
シリーズ名: Science et technique du froid = Refrigeration science and technology ; 1994-5
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6.

図書
図書
6. New developments in refrigeration for food safety and quality : proceedings of the meeting of Commission C2 with Commissions B2, D1, and D2-3 = Derniers progrès en matière de froid pour la sécurité et la qualité alimentaires : compte rendu de la réunion de Commission C2 avec Commissions B2, D1, et D2-3
issued for International Institute of Refrigeration = edité par Institute international de froid
出版情報: [St. Joseph, Mich.] : American Society of Agricultural Engineers, c1996  viii, 318 p. ; 23 cm
シリーズ名: Science et technique du froid = Refrigeration science and technology ; 1996-6
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7.

図書
図書
7. Practical applications of infrared thermal sensing and imaging equipment
Herbert Kaplan
出版情報: Bellingham, Wash. : SPIE Optical Engineering Press, c1993  xiv, 137 p. ; 26 cm
シリーズ名: Tutorial texts in optical engineering ; v. TT 13
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目次情報: 続きを見る
Preface
Basics and Instrument Overview / Part I：
Introduction / Chapter 1：
The Reasons for Using Infrared Instruments / 1.1：
Advantages of Noncontact Thermal Measurement / 1.2：
Some Historical Background / 1.3：
An Overview of This Text / 1.4：
Basics of Noncontact Thermal Measurements / Chapter 2：
Heat Transfer and Radiation Exchange Basics / 2.1：
Heat and Temperature / 2.1.1：
Converting Temperature Units / 2.1.2：
The Three Modes of Heat Transfer / 2.1.3：
Conduction / 2.1.4：
Convection / 2.1.5：
Radiation / 2.1.6：
Radiation Exchange at the Target Surface / 2.1.7：
Specular and Diffuse Surfaces / 2.1.8：
Transient Heat Exchange / 2.1.9：
The Infrared Measurement Problem / 2.2：
Noncontact Thermal Measurements / 2.2.1：
The Target Surface / 2.2.2：
The Transmitting Medium / 2.2.3：
The Measuring Instrument / 2.2.4：
Introduction to Thermal Scanning and Imaging Instruments / 2.3：
Line Scanning / 2.3.1：
Two-dimensional Scanning / 2.3.2：
Multidetector Scanners and SPRITE Technology / 2.3.3：
Infrared Focal Plane Array (IRFPA) Imagers / 2.3.4：
Pyroelectric Vidicon Thermal Imagers / 2.3.5：
Matching the Instrument to the Application / Chapter 3：
Point-Sensing Instruments / 3.1：
Scanners and Imagers--Qualitative and Quantitative / 3.2：
Performance Parameters of Imaging Radiometers / 3.2.1：
Thermal Imaging Software / 3.3：
Overview of Instruments / Chapter 4：
Introduction and Classification of Instruments / 4.1：
Instrument Manufacturers / 4.2：
Discussion of Instruments / 4.3：
Point Sensors (Radiation Thermometers) / 4.3.1：
Infrared Thermocouples and Probes / 4.3.1.1：
Portable Hand-held Group / 4.3.1.2：
On-line Monitoring and Control / 4.3.1.3：
Special / 4.3.1.4：
Line Scanners / 4.3.2：
Portable Line Scanner / 4.3.2.1：
On-line (Monitoring and Control) Line Scanners / 4.3.2.2：
Thermographic / 4.3.3：
Mechanically Scanned Thermal Viewers / 4.3.3.1：
Electronically Scanned Thermal Viewers (Pyrovidicon Imagers) / 4.3.3.2：
"Staring" FPA Thermal Viewers (Qualitative) / 4.3.3.3：
Thermographic Raster Scanners (Imaging Radiometers) / 4.3.3.4：
FPA Imaging Radiometers (Quantitative) / 4.3.3.5：
Thermal Imaging Diagnostic Software / 4.4：
Quantitative Thermal Measurements of Targets / 4.4.1：
Detailed Processing and Image Diagnostics / 4.4.2：
Image Recording, Storage and Recovery / 4.4.3：
Image Comparison / 4.4.4：
Report and Database Preparation / 4.4.5：
Recording, Hard Copy and Storage of Images and Data / 4.5：
Using Ir Sensing and Imaging Instruments / Chapter 5：
Introduction: The Thermal Behavior of the Target / 5.1：
Emissivity Difference / 5.1.1：
Reflectance Difference / 5.1.2：
Transmittance Difference / 5.1.3：
Geometric Difference / 5.1.4：
Mass Transport Difference / 5.1.5：
Phase-change Difference / 5.1.6：
Thermal Capacitance Difference / 5.1.7：
Induced Heating Difference / 5.1.8：
Energy Conversion Difference / 5.1.9：
Direct Heat Transfer Difference / 5.1.10：
Learning about the Target Environment / 5.1.11：
Preparation of Equipment for Operation / 5.2：
Calibration / 5.2.1：
Checking Calibration / 5.2.1.1：
Transfer Calibration / 5.2.1.2：
The Equipment Checklist / 5.2.2：
Equipment Checkout and Calibration / 5.2.3：
Batteries / 5.2.4：
Avoiding Common Mistakes in Instrument Operation / 5.3：
Start-up Procedure / 5.3.1：
Memorizing the Default Values / 5.3.2：
Setting the Correct Emissivity / 5.3.3：
Filling the IFOV meas for Accurate Temperature Measurements / 5.3.4：
Aiming Normal to the Target Surface / 5.3.5：
Recognizing and Avoiding Reflections from External Sources / 5.3.6：
Avoiding Radiant Heat Damage to the Instrument / 5.3.7：
Instrument Applications / Part II：
Introduction to Applications / Chapter 6：
Plant Condition Monitoring and Predictive Maintenance / Chapter 7：
Electrical / 7.1：
High Electrical Resistance / 7.2.1：
Short Circuits / 7.2.2：
Open Circuits / 7.2.3：
Inductive Currents / 7.2.4：
Energized Grounds / 7.2.5：
Condition Guidelines / 7.2.6：
Mechanical / 7.3：
Friction / 7.3.1：
Valve or Pipe Blockage/Leakage / 7.3.2：
Insulation within the Plant or Facility / 7.3.3：
Miscellaneous Applications / 7.4：
Rebar Location / 7.4.1：
Condenser Air In-leakage / 7.4.2：
Containment Spray Ring Headers / 7.4.3：
Hydrogen Igniters / 7.4.4：
Effluent Thermal Plumes / 7.4.5：
Buildings and Infrastructure / Chapter 8：
Measuring Insulating Properties / 8.1：
Considering the Total Structure / 8.3：
Industrial Roof Moisture Detection / 8.4：
Thermographic Inspection of Our Aging Infrastructure / 8.5：
Materials Testing / Chapter 9：
Materials Testing--Infrared Nondestructive Testing / 9.1：
Failure Modes and Establishment of Acceptance Criteria / 9.2：
Selecting the IR Imaging System / 9.3：
Pulsed Heat Injection Applications / 9.4：
Boiler Tube Corrosion Thinning Assessment / 9.4.1：
Infrastructure NDT / 9.5：
Product and Process Monitoring and Control / Chapter 10：
The Evolution of Noncontact Process Control / 10.1：
Full Image Process Monitoring / 10.2：
Product Monitoring of Semiconductors / 10.3：
Steel Wire Drawing Machine Monitoring / 10.4：
Full Image Process Control / 10.5：
Closing the Loop--Examples / 10.6：
Night Vision, Security and Surveillance / Chapter 11：
Nonmilitary Applications / 11.1：
Aerial and Ground (Sea) Based Search and Rescue / 11.2.1：
Firefighting / 11.2.2：
Space and Airborne Reconnaissance / 11.2.3：
Police Surveillance and Crime Detection and Security / 11.2.4：
Drivers' Aid Night Vision / 11.2.5：
Commercial Instrument Performance Characteristics / Appendix A：
Manufacturers of Ir Sensing and Imaging Instruments / Appendix B：
Generic Emissivities of Materials / Appendix C：
Preface
Basics and Instrument Overview / Part I：
Introduction / Chapter 1：
8.

図書
図書
8. Programming concepts and methods : PROCOMET '98 : IFIP TC2/WG2.2, 2.3 International Conference on Programming Concepts and Methods (PROCOMET '98), 8-12 June 1998, Shelter Island, New York, USA
edited by David Gries, Willem-Paul de Roever
出版情報: London : Chapman & Hall, c1998  viii, 486 p. ; 24 cm
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9.

図書
図書
9. CFCs, the day after, Padova, 21-23 Sept. 1994 : proceedings of meetings of commissions B1, B2, E1, E2 = L'après CFC, Padova, 21-23 Sept. 1994 : compte rendu de la réunion des commisions B1, B2, E1, E2
issued for International Institute of Refrigeration = edité pour Institut International du Froid
出版情報: Paris : Institut International du Froid, [1994]  xxxii, 837 p. ; 24 cm
シリーズ名: Science et technique du froid = Refrigeration science and technology ; 1994-2
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10.

図書
図書
10. 2nd ACM conference on computer and communications security, Nov 2-4 1994, Fairfax, Virginia
sponsored by ACM SIGSAC
出版情報: New York : Association for Computing Machinery, c1994  x, 293 p. ; 28 cm
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