2001 6th International Workshop on Statistical Methodology : IWSM, June 10, 2001, Kyoto / technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI Symposium, the Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, Information and Communication Engineers

資料種別:

図書

出版情報:

Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2001

形態:

vi, 67 p. ; 28 cm

著者名:

International Workshop on Statistical Metrology <DA12290655>

IEEE Electron Devices Society <DA01257512>

VLSI Symposium

応用物理学会 <DA00633233>

IEEE ED Tokyo Chapter <DA13240233>

電子情報通信学会 <DA01657532>

さらに 1 件

ISBN:

9780780366886 [0780366883] (: soft.)

書誌ID:

BA53798097