ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC

所蔵情報QRコード

ITC : International Test Conference : Meeting the tests of time, August 29-31, 1989, Sheraton Washington Hotel, Washington, DC / Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section

資料種別:

図書

出版情報:

Washington, D.C. ; Tokyo : IEEE Computer Society Press
New York, N.Y. : Institute of Electrical and Electronics Engineers, c1989

形態:

xxxiv, 959 p. ; 28 cm

著者名:

ISBN:

9780818689628 [0818689625]

書誌ID:

BA10142876

子書誌情報

フルテキスト

所蔵情報

他の版・巻

書誌詳細

その他の標題:	1989 IEEE International Test Conference 1962 89CH27425 264620X
注記:	"IEEE Computer Society Order Number 1962" "IEEE Catalog Number 89CH2742-5" "SAN 264-620X" Includes bibliographies and index
言語:	英語

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