close
1.

図書

図書
editors R. Rivas & M.A. López-Quintela
出版情報: Singapore : World Scientific, c1998  xx, 593 p. ; 23 cm
所蔵情報: loading…
2.

図書

図書
editor: D.J. Fisher
出版情報: [Uetikon-Zuerich] : Scitec Publications, c1998-  v. ; 25 cm
所蔵情報: loading…
目次情報: 続きを見る
Original Papers
IR Studies of Oxygen-Vacancy Related Defects in Irradiated Silicon / C.A.Londos ; L.G.Fytros ; G.J.Georgiou
Calculation of Cd Diffusion Profiles in GaAs / E.Antoncik
Theory of Enhanced/Retarded Diffusion of Donor/Acceptor Dopants in Predoped Silicon
Ga Self-Diffusion in GaAs / P.Murugan ; K.Ramachandran
Abstracts: Defects and Diffusion in Semiconductors
Author Index
Keyword Index
Invited Papers
Defect Distribution on Epilayer/Substrate Interfaces of ISOVPE-MCT Films / U.Gilabert ; A.B. Trigubo ; R. Gonzalez ; N.E. Walsoe de Reca
Defects in Implanted Hg[subscript 1-x]Cd[subscript x]Te: Electrical and Structural Characterization / M.Aguirre ; H. Canepa ; E. Heredia
Dislocations in GaAs: Their Impact on Electronic and Atomic Processes / T.Wosinski ; T.Figielski
Electronic Structures of Dangling-Bond Structures Fabricated on Hydrogen-Terminated Si(100)-2 x 1 Surfaces / T. Hitosugi ; T. Hashizume ; S. Heike ; H. Kajiyama ; Y. Wada ; S. Watanabe ; T. Hasegawa ; K. Kitazawa
Recent Progress in the Understanding of Surface Diffusion: Influence of Phase Transitions and Surface Heterogeneities / F. Nieto ; A.A. Tarasenko ; C. Uebing
Some Non-Fickian Diffusion Equations: Theory and Applications / A.K. Das
Dopant Migration Caused by Point Defect Gradients / K. Maser
Original Papers
IR Studies of Oxygen-Vacancy Related Defects in Irradiated Silicon / C.A.Londos ; L.G.Fytros ; G.J.Georgiou
Calculation of Cd Diffusion Profiles in GaAs / E.Antoncik
3.

図書

図書
editor: D.J. Fisher
出版情報: [Uetikon-Zuerich] : Scitec Publications, c1998  344 p. ; 25 cm
所蔵情報: loading…
4.

図書

図書
W. Kurz, D.J. Fisher
出版情報: Aedermannsdorf, Switzerland : Trans Tech Publications, 1998  305 p. ; 25 cm
所蔵情報: loading…
5.

図書

図書
ed. by B. Bokstein and N. Balandina
出版情報: Zuerich : Scitec Publications, c1998  xvi, 276 p. ; 25 cm
シリーズ名: Diffusion and defect data : solid state data ; pt. A . Defect and diffusion forum ; v. 156
所蔵情報: loading…
目次情報: 続きを見る
Committees and Sponsors
Preface
List of Participants
Grain Boundary Diffusion and Oxidation Processes / J. Philibert
Influence of Grain Boundary Diffusion on Thin Film Reactions / P. Gas
Motion of the Grain Boundary System with the Triple Junctions / L.S. Shvindlerman ; G. Gottstein ; U. Czubayko ; V.G. Sursaeva
Study of Grain-Boundary Diffusion of Au in Copper within [Sigma]5 Misorientation Range in the Context of Structure of Grain Boundaries / E. Budke ; Chr. Herzig ; S. Prokofjev ; L. Shvindlerman
Grain Boundary Diffusion in Polycrystalline Solids with an Arbitrary Grain Size / S.V. Divinski
Pseudo Type-B Diffusion Regime in Cu Grain Boundaries below 250 [degree]C / D. Gupta
Segregation and Grain Boundary Diffusion in Metals and Elemental Semi-Conductors / J. Bernardini
Nonlinear Segregation Effects on Grain Boundary Heterodiffusion. Extraction of Segregation Term from a Triple Product / B. Bokstein ; A. Ostrovsky
Solute Diffusion and Segregation in Grain Boundaries of Silver and Copper / T. Surholt ; C. Minkwitz
Grain Boundary Diffusion and Stability of the Triple Junctions / A.N. Aleshin ; W. Gust ; E. Rabkin
A New Method for Grain Boundary Diffusion Coefficient Measurement / R. Le Gall ; G. Saindrenan ; D. Roptin
Structure, Bonding and Property Changes due to Grain Boundary Segregation / Sh. Subramanian ; D.A. Muller ; J. Silcox ; S.L. Sass
Complex Atomic-Scale Dynamics in Grain Boundaries in Silicon / S.T. Pantelides ; A. Maiti ; M. Chisholm ; S.J. Pennycook
Relation between Segregation at Interfaces, Structure and Diffusion in Germanium / A. Charai ; A. Rolland ; F. Cabane
Microscopic Investigation of Surface Segregation in Random Alloys / A.Yu. Lozovoi ; P.A. Korzhavyi ; Yu.Kh. Vekilov
Segregation, Phase Separation and Grain Boundary Diffusion in Thin Films / Cs. Cserhati ; D.L. Beke ; I. A. Szabo
AES Study of the Mass Transport of Nickel near Ni / Cu (111) Interface / Zs. Tokei
Grain Boundary Segregation in the Cu-Bi System / L.-S. Chang ; B.B. Straumal ; S. Hofmann ; B. Baretzky
Grain Boundary Electromigration in Thin Films: Interface Reaction and Segregation Effects / E.E. Glickman
Grain Boundary Diffusion, Electromigration and Segregation in Cu and Cu-2wt% Sn Alloy
The Effect of Pressure on Grain Boundary Wetting, Segregation and Diffusion / W. Lojkowski ; B. Straumal
Strain Induced Grain Boundary Premelting due to Heavy Pile-up of Screw Dislocations in Deformed Copper Bicrystals / F. Inoko ; T. Okada ; T. Yoshikawa
Copper Diffusion in Nickel Thin Films under Stresses in the Kinetic Regime "B" / N. Balandina
Influence of Precipitates on the Grain Boundary Diffusion: A Perturbative Approach / N.S. Khader ; D.E. Mekki ; R.J. Tarento
The Manifestations of the Diffusion-Coefficient Distribution Functions of the Grain Boundaries in W and Au Polycrystals / M.I. Kurkin ; S.M. Klotsman ; A.N. Timofeev ; V.V. Dyakin
The Study of the Diffusion of [superscript 57]Co in Polycrystalline Gold at the Upper Boundary of the Temperature Interval Ordinarily used in Intercrystallite Diffusion Investigations / V.K. Rudenko
Low-Temperature Interdiffusion in Binary and Multilayer Thin Film System / S.I. Sidorenko ; S.M. Voloshko ; M.A. Vasiliev
Exact Solution of Triple Junction Diffusion Problem / V.A. Ivanov ; A.S. Ostrovsky ; A.L. Peteline ; S.A. Peteline
Relaxation Processes in Ultrafine-Grained Copper Processed by Severe Plastic Deformation / N.M. Amirkhanov ; R.K. Islamgaliev
Growth and Healing of Voids at Grain Boundary during High Temperature Creep / V.S. Gostomelskii
Mechanisms of Grain Boundary Diffusion in Intermetallic Compounds / L.N. Larikov
Grain Boundary Diffusion in Thin Films under Stress Field in Kinetic Regime "C"
Diffusion in Intermetallics / Round Table Discussion I:
Grain Boundary Wetting and Liquid Grooving / Round Table Discussion II:
Author Index
Keyword Index
Committees and Sponsors
Preface
List of Participants
文献の複写および貸借の依頼を行う
 文献複写・貸借依頼