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1.

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図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2002  viii, 476 p. ; 28 cm
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2.

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図書
editor, Joe Staudinger ; sponsored by the IEEE Microwave Theory and Techniques Society, the IEEE Electron Devices Society and the IEEE Solid State Circuits Society
出版情報: [New York] : Institute of Electrical and Electronics Engineers, c2002  xxxi, 501 p. ; 28 cm
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3.

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図書
sponsored by the IEEE Solid State Circuits Society and the Electron Devices Society
出版情報: Piscataway, NJ : IEEE Operations Center, c2002  524 p. ; 28 cm
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4.

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Sponsored by IEEE Electron Devices Society and the Institute of Electrical Engineers of Japan
出版情報: Piscataway, N. J. : IEEE Service Center, c2002  xx, 311 p. ; 28 cm
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5.

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図書
sponsored by the IEEE Electron Devices Society and IEEE Lasers and Electro-Optics Society
出版情報: Piscataway, N. J. : IEEE Operations Center, c2002  v, 750 p. ; 30 cm
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6.

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[organized by National Institute for Research and Development in Microtechnologies (IMT) ; under the aegis of Romanian Academy Electrochemical Society Inc. ; co-sponsored by IEEE Electron Devices Society ... [et al.]]
出版情報: Piscataway, N. J. : IEEE Operations Center, c2001  2 v. (xx, 584 p.) ; 29 cm
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7.

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図書
edited by Wilson Tan ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore
出版情報: Piscataway, NJ : Institute of Electrical and Electronics Engineers, c2001  262 p. ; 30 cm
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8.

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図書
sponsored by the IEEE Electron Devices Society
出版情報: Piscataway, N.J. : IEEE Service Center, c2002  xiv, 216 p. ; 28 cm
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9.

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sponsored by IEEE Electron Devices Society ; in cooperation with IEEE Solid State Circuits Society
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2002  241 p. ; 28 cm
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10.

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the IEEE Electron Devices Society, the Japan Society of Applied Physics
出版情報: Geithersburg, MD : Widerkehr and Associates, c2002  xii, 228 p. ; ill. ; 28 cm
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11.

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sponsored by IEEE Electron Devices Society ; in cooperation with IEEE Solid State Circuits Society IEEE Twin Cities Section
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2001  199 p. ; 28 cm
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12.

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[sponsored by IEEE Electron Devices Society, IEEE Components Packaging and Manufacturing Technology Society, Semiconductor Equipment & Materials International (SEMI), and Society of Applied Physics of Japan]
出版情報: Piscataway, N.J. : IEEE Service Center, c2001  xi, 525 p. ; 28 cm
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13.

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sponsored by the Institute of Electrical and Electronic Engineers, Electron Devices Society ... [et al.]
出版情報: Piscataway, N.J. : IEEE Service Center, c2001  225 p. ; 28 cm
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14.

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図書
co-sponsored by the IEEE Electron Devices Society, the IEEE Microwave Theory and Techniques Society, and the IEEE Solid-State Circuits Society
出版情報: Piscataway, N.J. : IEEE Service Center, c2001  ix, 279 p. ; 29 cm
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図書
sponsored by the IEEE Electron Devices Society
出版情報: Piscataway, N.J. : IEEE Service Center, c2001  x, 158 p. ; 28 cm
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16.

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International Semiconductor Conference ; National Institute for Research and Development in Microtechnologies ; Romanian Academy Elecrochemical Society ; IEEE Electron Devices Society
出版情報: [New York] : IEEE, c2000  2 v. ; 29 cm
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17.

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図書
MTT/ED/AP/LEO Societies Joint Chapter, United Kingdom and Republic of Ireland Section ; with technical co-sponsorship from IEEE Electron Device Society
出版情報: [New York] : IEEE, c2000  280 p. ; 30 cm
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18.

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図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2001  x, 464 p. ; 28 cm
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19.

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図書
sponsored by the IEEE Solid State Circuits Society and the Electron Devices Society
出版情報: [United States] : IEEE, c2001  582 p. ; 28 cm
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20.

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[sponsored by Industrial Technology Research Institute, ROC ; in cooperation with Chinese Institute of Engineers, ROC ... [et al.]
出版情報: [United States] : IEEE, ITRI, c2001  310, iii p. ; 30 cm
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21.

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Manfred Engelhardt, Terence Hook, and Calvin T. Gabriel, ; technical co-sponsors, American Vacuum Society, IEEE/Electron Devices Society, Japanese Society of Applied Physics
出版情報: Santa Clara, Calif. : American Vacuum Society - Northen California Chapter, c2001  i, 128 p. ; 28 cm
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22.

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editor, Luciano Boglione ; sponsored by the IEEE Microwave Theory and Techniques Society and the IEEE Electron Devices Society
出版情報: [New York] : Institute of Electrical and Electronics Engineers, c2001  xxv, 300 p. ; 28 cm
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23.

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sponsored by the Japan Society of Applied Physics, IEEE Lasers and Electro-Optics Society, and IEEE Electron Devices Society ; in cooperation with the Institute of Electronics, Information and Communication Engineers, Optoelectronic Industry and Technology Development Association and the Research and Development Association for Future Electron Devices
出版情報: [United States] : IEEE, c2001  xiii, 635 p. ; 30 cm
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24.

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sponsored by Electron Devices Society of IEEE
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2001  951 p. ; 28 cm
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25.

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図書
sponsored by the IEEE Electron Devices Society
出版情報: Piscataway, NJ : IEEE Service Center, c2000  1839 p. ; 29 cm
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26.

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図書
sponsored by Electron Devices Society of IEEE
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2000  871 p. ; 28 cm
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27.

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sponsored by Electron Devices Society of IEEE
出版情報: Piscataway, N.J. : Institute of Electrical & Electronics Engineers, c1984  875 p. ; 28 cm
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28.

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co-sponsored by the IEEE Electron Devices Society, the IEEE Microwave Theory and Techniques Society, and the IEEE Solid-State Circuits Society
出版情報: Piscataway, N.J. : IEEE Service Center, c2000  ix, 266 p. ; 29 cm
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29.

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sponsored by ACM SIGDA and IEEE Circuits and Systems Society ; with technical co-sponsorship from the IEEE Solid-State Circuits Society and the IEEE Electron Devices Society
出版情報: New York : Association for Computing Machinery, c2001  xii, 395 p. ; 28 cm
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30.

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sponsored by the Japan Society of Applied Physics ; technical cosponsored by IEEE Electron Devices Society ; in cooperation with the Institute of Electronics, Information and Communication Engineers ... [et al.]
出版情報: Tokyo : Japan Society of Applied Physics, c2001  xxxviii, 693 p. ; 30 cm
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31.

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Sponsored by the Institute of Electrical Engineers of Japan ; co-sponsored by the IEEE Electron Devices Society ; in cooperation with the Institute of Electronics Information and Communication Engineers of Japan and the Japan Society of Applied Physics
出版情報: Tokyo : Institute of Electrical Engineers of Japan, c2001  xxxi, 467 p. ; 30 cm
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32.

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図書
technical co-sponsored by IEEE Electron Devices Society ; co-sponsored by VLSI Symposium, the Japan Society of Applied Physics, IEEE ED Tokyo Chapter ; in cooperation with the Institute of Electronics, Information and Communication Engineers
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2001  vi, 67 p. ; 28 cm
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33.

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sponsored by IEEE Electron Devices Society and Department of Electronic and Information Engineering, the Hong Kong Polytechnic University
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2001  vii, 157 p. ; 28 cm
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34.

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editors, Charles E. Hunt, Andrei G. Chakhovskoi, Nikolai N. Chubun, Mahua Hajra
出版情報: Piscataway, NJ. : Institute of Electrical and Electronics Engineers, c2001  xv, 313 p. ; 28 cm
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35.

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the Japan Society of Applied Physics, the IEEE Electron Devices Society
出版情報: Tokyo : Business Center for Academic Societies Japan, c2001  xv, 150 p. ; ill. ; 28 cm
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36.

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IEEE International Conference on Computer Design ; IEEE Computer Society ; IEEE Circuits and Systems Society ; IEEE Electron Devices Society
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2001  xxii, 559 p. ; 28 cm
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目次情報: 続きを見る
Welcome to ICCD
Organizing Committee
Program Committee
Additional Reviewers
ICCD 2002 Call for Papers
Keynote Addresses
The In-Car Computing Network: A Challenge for Embedded Systems / K.-T. Neumann
Clear and Present Tensions in Microprocessor Design / J. Shen
Moore's Law Meets Shannon's Law: The Evolution of the Communications Industry / L. Harrison
Technical Program
Asynchronous Techniques / Session 1.1:
Mousetrap: Ultra-High-Speed Transition-Signaling Asynchronous Pipelines / M. Singh ; S. M. Nowick
Arithmetic Logic Circuits using Self-Timed Bit Level Dataflow and Early Evaluation / R. B. Reese ; M. A. Thornton ; C. Traver
Efficient Systematic Error-Correcting Codes for Semi-Delay-Insensitive Data Transmission / F.-C. Cheng ; S.-L. Ho
Embedded Tutorial / Session 1.2:
Session Abstract
Design Constraints for Efficient Cryptographic Processing in Smart Cards / J.-F. Dhem
Security of Smartcard Integrated Circuits / E. von Faber
Architectural Modeling: Performance and Power Analysis / Session 1.3:
Minimal Subset Evaluation: Rapid Warm-Up for Simulated Hardware State / J. W. Haskins, Jr. ; K. Skadron
A Framework for Energy Estimation of VLIW Architecture / H. S. Kim ; N. Vijaykrishnan ; M. Kandemir ; M. J. Irwin
High-Level Power Modeling of CPLDs and FPGAs / L. Shang ; N. K. Jha
Caching / Session 2.1:
Symbolic Cache: Fast Memory Access Based on Program Syntax Correlation of Loads and Stores / Q. Ma ; J.-K. Peir ; L. Peng ; K. Lai
In-Line Interrupt Handling for Software-Managed TLBs / A. Jaleel ; B. Jacob
Design of a Predictive Filter Cache for Energy Savings in High Performance Processor Architectures / W. Tang ; R. Gupta ; A. Nicolau
Simulation Based Verification / Session 2.2:
A New Functional Test Program Generation Methodology / F. Fallah ; K. Takayama
A Functional Validation Technique: Biased-Random Simulation Guided by Observability-Based Coverage / S. Tasiran ; D. G. Chinnery ; S. J. Weber ; K. Keutzer
Selecting a Well Distributed Hard Case Test Suite for IEEE Standard Floating Point Division / L. D. McFearin ; D. W. Matula
Modeling of Capacitance and Crosstalk Noise / Session 2.3:
Linear Time Hierarchical Capacitance Extraction without Multipole Expansion / S. Balakrishnan ; J. H. Park ; H. Kim ; Y.-M. Lee ; C. C.-P. Chen
Analysis and Reduction of Capacitive Coupling Noise in High-Speed VLSI Circuits / P. Heydari ; M. Pedram
Crosstalk Noise Estimation for Generic RC Trees / M. Takahashi ; M. Hashimoto ; H. Onodera
Improving the Performance of Caching Structures / Session 3.1:
A Banked-Promotion TLB for High Performance and Low Power / J.-H. Lee ; J.-S. Lee ; S.-W. Jeong ; S.-D. Kim
Filtering Superfluous Prefetches Using Density Vectors / W.-F. Lin ; S. K. Reinhardt ; D. Burger ; T. R. Puzak
Allocation by Conflict: A Simple, Effective Multilateral Cache Management Scheme / E. S. Tam ; S. A. Vlaovic ; G. S. Tyson ; E. S. Davidson
Test Pattern Generation, Test Compaction, and Test Point Insertion for Synchronous Sequential Circuits / Session 3.2:
COREL: A Dynamic Compaction Procedure for Synchronous Sequential Circuits with Repetition and Local Static Compaction / I. Pomeranz ; S. M. Reddy
A Partitioning and Storage Based Built-In Test Pattern Generation Method for Synchronous Sequential Circuits
Cost-Effective Non-Scan Design for Testability for Actual Testability Improvement / D. Xiang ; Y. Xu
Power 4 Microprocessor / Session 3.3 Invited Session:
Power4 Microprocessor and System Design / J. Clabes
Power4 Design Methodology / B. Zoric
Semi-Custom Design Methodology for Power4 / P. Strenski
Power4 Integration / M. Scheuermann
Boolean Reasoning for Applications in CAD / A. KuehlmannSession 4.1:
Computer Arithmetic / Session 4.2:
Improved ZDN-Arithmetic for Fast Modulo Multiplication / H. Ploog ; S. Flugel ; D. Timmermann
Design Alternatives for Parallel Saturating Multioperand Adders / P. I. Balzola ; M. J. Schulte ; J. Ruan ; J. Glossner ; E. Hokenek
A Single-Multiplier Quadratic Interpolator for LNS Arithmetic / M. G. Arnold ; M. D. Winkel
Circuit Sizing and Optimization / Session 4.3:
Gate Sizing to Eliminate Crosstalk Induced Timing Violation / T. Xiao ; M. Marek-Sadowska
Performance Optimization by Wire and Buffer Sizing under the Transmission Line Model / T.-C. Chen ; S.-R. Pan ; Y.-W. Chang
Buffered Interconnect Tree Optimization using Lagrangian Relaxation and Dynamic Programming / S.-Y. Lai ; R. Baldick
Clocking and Time-Domain Measurements / Session 5.1:
Embedded Tutorial: Clocked Timing Elements for High-Performance and Low-Power VLSI Systems / V. Oklobdzija
Jitter-Induced Power/Ground Noise in CMOS PLLs: A Design Perspective
On the Micro-Architectural Impact of Clock Distribution Using Multiple PLLs / M. Saint-Laurent ; M. Swaminathan ; J. D. Meindl
On-Chip Oscilloscopes for Noninvasive Time-Domain Measurement of Waveforms / K. L. Shepard ; Y. Zheng
Processor Microarchitecture / Session 5.2:
Selective Branch Prediction Reversal by Correlating with Data Values and Control Flow / J. L. Aragon ; J. Gonzalez ; J. M. Garcia ; A. Gonzalez
Mutable Functional Units and Their Applications on Microprocessors / Y. Solihin ; K. W. Cameron ; Y. Luo ; D. Lavenier ; M. Gokhale
Compiler-Directed Classification of Value Locality Behavior / Q. Zhao ; D. J. Lilja
A Hierarchical Dependence Check and Folded Rename Mapping Based Scalable Dispatch Stage / V. Sankaranarayanan ; A. Tyagi
Invited Session: Taming Tons of Gigabytes: Innovations in Disk Drive Electronics / Session 5.3:
Designing Circuits for Disk Drives / G. Pelz
Hard Disk Controller: The Disk Drive's Brain and Body / J. Jeppensen ; W. Allen ; S. Anderson ; M. Pilsl
Motion-Control: The Power Side of Disk Drives / W. Sereinig
Energy Efficiency Caches and Multiport Cache Structures / Session 6.1:
Static Energy Reduction Techniques for Microprocessor Caches / H. Hanson ; M. S. Hrishikesh ; V. Agarwal ; S. W. Keckler
Parallel Cachelets / D. Limaye ; R. Rakvic ; J. P. Shen
Access Region Cache: A Multi-Porting Solution for Future Wide-Issue Processors / B. S. Thakar ; G. Lee
Control by Simulation and On-line Checking / Session 6.2:
Distributed Event-Driven Simulation of VHDL-SPICE Mixed-Signal Circuits / D. Lungeanu ; C. J. R. Shi
High Performance Parallel Fault Simulation / A. K. Varshney ; B. Vinnakota ; E. Skuldt ; B. Keller
On-Line Integrity Monitoring of Microprocessor Control Logic / S. Kim ; A. K. Somani
CAD Algorithms for Physical Design / Session 6.3:
A Timing-Driven Macro-Cell Placement Algorithm / F. Mo ; A. Tabbara ; R. K. Brayton
Fixed-Outline Floorplanning through Better Local Search / S. N. Adya ; I. L. Markov
Generic ILP-Based Approaches for Dynamically Reconfigurable FPGA Partitioning / G.-M. Wu ; J.-M. Lin ; M. C.-T. Chao
Panel Discussion
How Much Longer Will SuperScalar Microarchitectures Scale? / D. Burger (chair) ; M. Hill ; M. Hopkins ; M. McDermott ; Y. Patt ; M. Snyder ; G. Sohi
Invited Session: Network Processors / Session 7.1:
Network Processing: Applications and Challenges / C. Narad
Payload+: Fast Pattern Matching and Routing for OC-48 / D. Kramer
Scaling Fully Programmable Network Processing to 10Gbps and Beyond / K. Morris
Formal Methods for Property Verification and Equivalence Verification / Session 7.2:
Arithmetic Transforms for Verifying Compositions of Sequential Datapaths / K. Radecka ; Z. Zilic
Hierarchical Image Computation with Dynamic Conjunction Scheduling / C. Meinel ; C. Stangier
Introduction to Generalized Symbolic Trajectory Evaluation / J. Yang ; C.-J. H. Seger
Hardware Representation / Session 7.3:
BDD Variable Ordering by Scatter Search / W. N. N. Hung ; X. Song
Lower Bound Based DDD Minimization for Efficient Symbolic Circuit Analysis / A. Manthe ; C-J. R. Shi
Run-Time Execution of Reconfigurable Hardware in a Java Environment / L. A. S. King ; H. Quinn ; M. Leeser ; D. Galatopoullos ; E. Manolakos
Circuit Techniques / Session 8.1:
Realization of Multiple-Output Functions by Reconfigurable Cascades / Y. Iguchi ; T. Sasao ; M. Matsuura
A Low-Power Cache Design for CalmRISC-Based Systems / S. Cho ; W. Jung ; Y. Kim
Interconnect-Centric Array Architectures for Minimum SRAM Access Time / A. J. Bhavnagarwala ; S. Kosonocky
Understanding and Addressing the Noise Induced by Electrostatic Discharge in Multiple Power Supply Systems / J. Lee ; Y. Huh ; P. Bendix ; S.-M. Kang
DSP/Multimedia / Session 8.2:
Cost-Effective Hardware Acceleration of Multimedia Applications / D. Talla ; L. K John
MPEG Macroblock Parsing and Pel Reconstruction on an FPGA-Augmented TriMedia Processor / M. Sima ; S. Cotofana ; S. Vassiliadis ; J. T. J. van Eijndhoven ; K. Vissers
Low-Energy DSP Code Generation Using a Genetic Algorithm / M. Lorenz ; R. Leupers ; P. Marwedel ; T. Drager ; G. Fettweis
Voltage Scaling for Energy Minimization with QoS Constraints / A. Manzak ; C. Chakrabarti
Novel Architectures and ISA Extensions / Session 8.3:
Matching Architecture to Application via Configurable Processors: A Case Study with Boolean Satisfiability Problem / Y. Zhao ; S. Malik ; A. Wang ; M. W. Moskewicz ; C. F. Madigan
Architectural Enhancements for Fast Subword Permutations with Repetitions in Cryptographic Applications / J. P. McGregor ; R. B. Lee
3DCGiRAM: An Intelligent Memory Architecture for Photo-Realistic Image Synthesis / H. Kobayashi ; K. Suzuki ; K. Sano ; Y. Kaeriyama ; Y. Saida ; N. Oba ; T. Nakamura
Use of Local Memory for Efficient Java Execution / S. Tomar
Poster Papers
An Analytical Model for Trace Cache Instruction Fetch Performance / A. Hossain ; D. J. Pease
Performance Driven Global Routing through Gradual Refinement / J. Hu ; S. S. Sapatnekar
Fuzzified Iterative Algorithms for Performance Driven Low Power VLSI Placement / S. M. Sait ; H. Youssef ; J. A. Khan ; A. El-Maleh
Fast Specification of Cycle-Accurate Processor Models / F. S.-H. Chang ; A. J. Hu
A Performance Analysis of the Active Memory System / W. Srisa-an ; C.-T. D. Lo ; J. M. Chang
Combined IEEE Compliant and Truncated Floating Point Multipliers for Reduced Power Dissipation / K. E. Wires ; J. E. Stine
An Algorithm for Dynamically Reconfigurable FPGA Placement
RC-In RC-Out Model Order Reduction Accurate up to Second Order Moments / P. Ganesh
Efficient Function Approximation for Embedded and ASIC Applications / J. W. Hauser ; C. N. Purdy
An Area-Efficient Iterative Modified-Booth Multiplier Based on Self-Timed Clocking / M.-C. Shin ; S.-H. Kang ; I.-C. Park
A Heuristic for Multiple Weight Set Generation / H.-S. Kim ; S. Kang
Towards a Formal Model of Shared Memory Consistency for Intel Itanium / P. Chatterjee ; G. Gopalakrishnan
Efficient Algorithms for Subcircuit Enumeration and Classification for the Module Identification Problem / J. L. White ; M.-J. Chung ; A. S. Wojcik ; T. E. Doom
MCOMA: A Multithreaded COMA Architecture / H. El Naga ; J.-L. Gaudiot
Automatic Generation and Validation of Memory Test Models for High Performance Microprocessors / K. Zarrineh ; T. A. Ziaja ; A. Majumdar
Reducing Cache Pollution of Prefetching in a Small Data Cache / P. Reungsang ; S. K. Park ; H.-L. Roh
Alloyed Path-Pattern Scheme for Branch Prediction / R. Ramanujam ; M. Ravirala
Timing Characterization of Dual-Edge Triggered Flip-Flops / N. Nedovic ; M. Aleksic ; V. G. Oklobdzija
Performance Impact of Addressing Modes on Encryption Algorithms / A. M. Fiskiran
Determining Schedules for Reducing Power Consumption Using Multiple Supply Voltages / N. Chabini ; E. M. Aboulhamid ; Y. Savaria
Pre-Routing Estimation of Shielding for RLC Signal Integrity / J. D. Z. Ma ; A. Parihar ; L. He
Author Index
Welcome to ICCD
Organizing Committee
Program Committee
37.

図書

図書
Sponsored by the ESD Association in cooperation with IEEE ; thechnically co-sponsored by the Electron Devices Society
出版情報: New York : ESD Association, c1998  xii, 422 p. ; 28 cm
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38.

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図書
sponsored by the Japan Society of Applied Physics, IEEE Lasers and Electro-Optics Society, and IEEE Electron Devices Society
出版情報: [Piscataway, N.J.] : Institute of Electrical and Electronics Engineers, c2004  xiv, 778 p. ; 30 cm
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39.

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図書
sponsored by the IEEE Electron Devices Society (USA)
出版情報: [Piscataway, N.J.] : Institute of Electrical and Electronics Engineers, c2005  1822 p. ; 28 cm
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40.

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図書
The Japan Society of Applied Physics, The IEEE Electron Devices Society
出版情報: Tokyo : The Japan Society of Applied Physics, c2005  xx, 242 p. ; 29 cm
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41.

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図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: [Piscataway, N.J.] : Institute of Electrical and Electronics Engineers, c2005  xii, 764 p. ; 28 cm
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42.

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図書
sponsored by the IEEE Electron Devices Society
出版情報: [Piscataway, N.J.] : Institute of Electrical and Electronics Engineers, c2005  xii, 270 p. ; 30 cm
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43.

図書

図書
International Semiconductor Conference ; National Institute for Research and Development in Microtechnologies ; IEEE Electron Devices Society
出版情報: [Piscataway, N.J.] : Institute of Electrical and Electronics Engineers, c2001 [i.e. c2004]  2 v. (xviii, 520 p.) ; 29 cm
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44.

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図書
sponsored by the IEEE Electron Devices Society
出版情報: Piscataway, N.J. : IEEE, c2003  1 v. (various pagings) ; 29 cm
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45.

図書

図書
CICC 2005 is sponsored by IEEE Solid State Circuits Society and technically co-sponsored by the IEEE Electron Devices Society
出版情報: Piscataway, New Jersey : IEEE, c2005  1 v. (various pagings) ; 28 cm
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46.

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図書
sponsored by Electron Devices Society of IEEE
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2005  1 v. ; 28 cm
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47.

図書

図書
sponsored by ACM SIGDA and IEEE Circuits and Systems Society ; with technical co-sponsorship from the IEEE Solid-State Circuits Society and the IEEE Electron Devices Society
出版情報: New York : Association for Computing Machinery, c2002  xii, 330 p. ; 28 cm
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48.

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図書
sponsored by IEEE Electron Devices Society and Institute of Electrical Engineers of Japan
出版情報: [Piscataway, N.J.] : Institute of Electrical and Electronics Engineers, c2000 [i.e. c2005]  xxiii, 377 p. ; 28 cm
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49.

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図書
sponsored by the IEEE Electron Devices Society
出版情報: [New York] : Institute of Electrical and Electronics Engineers, c2004  xii, 313 p. ; 28 cm
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50.

図書

図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2002, c2004  xii, 748 p. ; 28 cm
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