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1.

図書

図書
John J. Videler
出版情報: [S.l.] : Springer-Science+Business Media, 1993  xx, 260 p. ; 24 cm
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2.

図書

図書
compiled by C.H. Andrusyshen and J.N. Krett ; assisted by Helen Virginia Andrusyshen
出版情報: [Toronto] : Published for the University of Saskatchewan by University of Toronto Press, 1993, c1955  xxix, 1163 p. ; 22 cm
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3.

雑誌

雑誌
Betriebswissenschaftliches Institut der Eidg. Technischen Hochschule
出版情報: Zürich : Industrielle Organisation, -1993
巻次年月次: 49. Jahrg. (1980)-62. Jahrg., Nr. 12 (1993)
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4.

雑誌

雑誌
Vereinigung Schweiz. Petroleum-Geologen und -Ingenieure
出版情報: [Swiss] : [s.n.], -[1993]  v ; 25 cm
巻次年月次: -v. 60, Nr. 137 (Dez. 1993)
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5.

雑誌

雑誌
Association pharmaceutique française pour l'hydrologie
出版情報: Paris : Association pharmaceutique française pour l'hydrologie, -1993  v
巻次年月次: -t. 24, fasc. 2 (1993)
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6.

図書

図書
Peter Coad and Jill Nicola
出版情報: London : Prentice-Hall International, c1993  xlii, 582 p. ; 23 cm.
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目次情報: 続きを見る
The Count / 1:
Getting Started with Some OOA
OOP--Problem Domain Component: Smalltalk
OOP--Problem Domain Component: C++
OOD--Human Interaction Component
OOD--Human Interaction Component: Smalltalk
OOP--Human Interaction Component: Smalltalk
OOD--Human Interaction Component: C++
OOP--Human Interaction Component: C++
ASCII Count
ASCII Count: Smalltalk
ASCII Count: C++
Date Count
Date Count: Smalltalk
Date Count: C++
Sequence Count
Sequence Count: Smalltalk
Sequence Count: C++
Summary
The Vending Machine / 2:
Some OOA
Some Planning
OOD--The Problem Domain Component (The First Round)
OOP--The Problem Domain Component: Smalltalk (The First Round)
OOP--The Problem Domain Component: C++ (The First Round)
About Implementing Connections with Other Objects
OOD--The Problem Domain Component (The Second Round)
OOP--The Problem Domain Component: Smalltalk (The Second Round)
OOP--The Problem Domain Component: C++ (The Second Round)
OOD--The Human Interaction Component: Smalltalk
About Making Change
Sales, Sales, Sales / 3:
OOD--Problem Domain Component
OOD--Data Management Component
OOP--Problem Domain Component Update: Smalltalk
OOP--Problem Domain Component Update: C++
OOP--Data Management Component: Smalltalk
OOP--Data Management Component: C++
Go With the Flow / 4:
OOP--The Problem Domain Component: Smalltalk
Epilogue
Appendixes
A--Practical Language Summaries
B--OOA and OOD Notation
C--OOP Principles
Bibliography.
The Count / 1:
Getting Started with Some OOA
OOP--Problem Domain Component: Smalltalk
7.

図書

図書
edited by T. Hasegawa ... [et al.]
出版情報: [Osaka] : Yamada Science Foundation, c1993  xx, 950 p. ; 23 cm
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8.

図書

図書
J.N. Reddy
出版情報: New York ; Tokyo : McGraw-Hill, c1993  xix, 684 p. ; 23 cm
シリーズ名: McGraw-Hill series in mechanical engineering
McGraw-Hill international editions
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9.

図書

図書
Herbert Kaplan
出版情報: Bellingham, Wash. : SPIE Optical Engineering Press, c1993  xiv, 137 p. ; 26 cm
シリーズ名: Tutorial texts in optical engineering ; v. TT 13
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目次情報: 続きを見る
Preface
Basics and Instrument Overview / Part I:
Introduction / Chapter 1:
The Reasons for Using Infrared Instruments / 1.1:
Advantages of Noncontact Thermal Measurement / 1.2:
Some Historical Background / 1.3:
An Overview of This Text / 1.4:
Basics of Noncontact Thermal Measurements / Chapter 2:
Heat Transfer and Radiation Exchange Basics / 2.1:
Heat and Temperature / 2.1.1:
Converting Temperature Units / 2.1.2:
The Three Modes of Heat Transfer / 2.1.3:
Conduction / 2.1.4:
Convection / 2.1.5:
Radiation / 2.1.6:
Radiation Exchange at the Target Surface / 2.1.7:
Specular and Diffuse Surfaces / 2.1.8:
Transient Heat Exchange / 2.1.9:
The Infrared Measurement Problem / 2.2:
Noncontact Thermal Measurements / 2.2.1:
The Target Surface / 2.2.2:
The Transmitting Medium / 2.2.3:
The Measuring Instrument / 2.2.4:
Introduction to Thermal Scanning and Imaging Instruments / 2.3:
Line Scanning / 2.3.1:
Two-dimensional Scanning / 2.3.2:
Multidetector Scanners and SPRITE Technology / 2.3.3:
Infrared Focal Plane Array (IRFPA) Imagers / 2.3.4:
Pyroelectric Vidicon Thermal Imagers / 2.3.5:
Matching the Instrument to the Application / Chapter 3:
Point-Sensing Instruments / 3.1:
Scanners and Imagers--Qualitative and Quantitative / 3.2:
Performance Parameters of Imaging Radiometers / 3.2.1:
Thermal Imaging Software / 3.3:
Overview of Instruments / Chapter 4:
Introduction and Classification of Instruments / 4.1:
Instrument Manufacturers / 4.2:
Discussion of Instruments / 4.3:
Point Sensors (Radiation Thermometers) / 4.3.1:
Infrared Thermocouples and Probes / 4.3.1.1:
Portable Hand-held Group / 4.3.1.2:
On-line Monitoring and Control / 4.3.1.3:
Special / 4.3.1.4:
Line Scanners / 4.3.2:
Portable Line Scanner / 4.3.2.1:
On-line (Monitoring and Control) Line Scanners / 4.3.2.2:
Thermographic / 4.3.3:
Mechanically Scanned Thermal Viewers / 4.3.3.1:
Electronically Scanned Thermal Viewers (Pyrovidicon Imagers) / 4.3.3.2:
"Staring" FPA Thermal Viewers (Qualitative) / 4.3.3.3:
Thermographic Raster Scanners (Imaging Radiometers) / 4.3.3.4:
FPA Imaging Radiometers (Quantitative) / 4.3.3.5:
Thermal Imaging Diagnostic Software / 4.4:
Quantitative Thermal Measurements of Targets / 4.4.1:
Detailed Processing and Image Diagnostics / 4.4.2:
Image Recording, Storage and Recovery / 4.4.3:
Image Comparison / 4.4.4:
Report and Database Preparation / 4.4.5:
Recording, Hard Copy and Storage of Images and Data / 4.5:
Using Ir Sensing and Imaging Instruments / Chapter 5:
Introduction: The Thermal Behavior of the Target / 5.1:
Emissivity Difference / 5.1.1:
Reflectance Difference / 5.1.2:
Transmittance Difference / 5.1.3:
Geometric Difference / 5.1.4:
Mass Transport Difference / 5.1.5:
Phase-change Difference / 5.1.6:
Thermal Capacitance Difference / 5.1.7:
Induced Heating Difference / 5.1.8:
Energy Conversion Difference / 5.1.9:
Direct Heat Transfer Difference / 5.1.10:
Learning about the Target Environment / 5.1.11:
Preparation of Equipment for Operation / 5.2:
Calibration / 5.2.1:
Checking Calibration / 5.2.1.1:
Transfer Calibration / 5.2.1.2:
The Equipment Checklist / 5.2.2:
Equipment Checkout and Calibration / 5.2.3:
Batteries / 5.2.4:
Avoiding Common Mistakes in Instrument Operation / 5.3:
Start-up Procedure / 5.3.1:
Memorizing the Default Values / 5.3.2:
Setting the Correct Emissivity / 5.3.3:
Filling the IFOV meas for Accurate Temperature Measurements / 5.3.4:
Aiming Normal to the Target Surface / 5.3.5:
Recognizing and Avoiding Reflections from External Sources / 5.3.6:
Avoiding Radiant Heat Damage to the Instrument / 5.3.7:
Instrument Applications / Part II:
Introduction to Applications / Chapter 6:
Plant Condition Monitoring and Predictive Maintenance / Chapter 7:
Electrical / 7.1:
High Electrical Resistance / 7.2.1:
Short Circuits / 7.2.2:
Open Circuits / 7.2.3:
Inductive Currents / 7.2.4:
Energized Grounds / 7.2.5:
Condition Guidelines / 7.2.6:
Mechanical / 7.3:
Friction / 7.3.1:
Valve or Pipe Blockage/Leakage / 7.3.2:
Insulation within the Plant or Facility / 7.3.3:
Miscellaneous Applications / 7.4:
Rebar Location / 7.4.1:
Condenser Air In-leakage / 7.4.2:
Containment Spray Ring Headers / 7.4.3:
Hydrogen Igniters / 7.4.4:
Effluent Thermal Plumes / 7.4.5:
Buildings and Infrastructure / Chapter 8:
Measuring Insulating Properties / 8.1:
Considering the Total Structure / 8.3:
Industrial Roof Moisture Detection / 8.4:
Thermographic Inspection of Our Aging Infrastructure / 8.5:
Materials Testing / Chapter 9:
Materials Testing--Infrared Nondestructive Testing / 9.1:
Failure Modes and Establishment of Acceptance Criteria / 9.2:
Selecting the IR Imaging System / 9.3:
Pulsed Heat Injection Applications / 9.4:
Boiler Tube Corrosion Thinning Assessment / 9.4.1:
Infrastructure NDT / 9.5:
Product and Process Monitoring and Control / Chapter 10:
The Evolution of Noncontact Process Control / 10.1:
Full Image Process Monitoring / 10.2:
Product Monitoring of Semiconductors / 10.3:
Steel Wire Drawing Machine Monitoring / 10.4:
Full Image Process Control / 10.5:
Closing the Loop--Examples / 10.6:
Night Vision, Security and Surveillance / Chapter 11:
Nonmilitary Applications / 11.1:
Aerial and Ground (Sea) Based Search and Rescue / 11.2.1:
Firefighting / 11.2.2:
Space and Airborne Reconnaissance / 11.2.3:
Police Surveillance and Crime Detection and Security / 11.2.4:
Drivers' Aid Night Vision / 11.2.5:
Commercial Instrument Performance Characteristics / Appendix A:
Manufacturers of Ir Sensing and Imaging Instruments / Appendix B:
Generic Emissivities of Materials / Appendix C:
Preface
Basics and Instrument Overview / Part I:
Introduction / Chapter 1:
10.

図書

図書
Ray W. Clough, Joseph Penzien
出版情報: New York : McGraw-Hill, 1993  xxii, 738 p. ; 25 cm
シリーズ名: McGraw-Hill civil engineering series
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