Proceedings : First Asian Test Symposium (ATS'92), November 26-27, 1992, Hiroshima, Japan / sponsored by IEEE Computer Society Test Technology Technical Committee
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IEEE Computer Society Press |
Institute of Electrical and Electronics Engineers, order from IEEE Computer Society |
IEEE Computer Society Press |
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図書
Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983
IEEE Computer Society Press |
IEEE Computer Society Press |
IEEE Computer Society Press |
IEEE Computer Society Press |
IEEE Computer Society Press |
IEEE Computer Society Press |
Institute of Electrical and Electronics Engineers, available from IEEE Computer Society Publications Office |
IEEE Computer Society Press |