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Conference Record : AUTOTESTCON '95, August 8-10, 1995, Atlanta, Georgia : "Systems Readiness: Test Technology for the 21st Century" / sponsored by: the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society

資料種別:
図書
出版情報:
Piscataway : IEEE Service Center, c1995
形態:
587 p. ; 28 cm
著者名:
ISBN:
9780780326217 [0780326210] (: soft.)
9780780326224 [0780326229] (: case.)
書誌ID:
BA26202423
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