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1.

図書

図書
sponsored by IEEE Electron Devices Society
出版情報: New York, NY : Institute of Electrical and Electronics Engineers, c1988  v, 206 p. ; 28 cm
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2.

図書

図書
sponsored by the IEEE Electron Devices Society
出版情報: [New York] : Institute of Electrical and Electronics Engineers, c1999  ix, 235 p. ; 29 cm
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3.

図書

図書
sponsored by the IEEE Electron Devices Society
出版情報: [New York] : Institute of Electrical and Electronics Engineers, c1998  x, 240 p. ; 30 cm
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4.

図書

図書
sponsored by the IEEE Electron Devices Society
出版情報: Piscataway : IEEE Service Center, c1997  viii, 225 p. ; 28 cm
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5.

図書

図書
IEEE International Conference on Microelectronic Test Structures ; IEEE Electron Devices Society
出版情報: Piscataway : IEEE Service Center, c1995  xi, 304 p. ; 28 cm
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6.

図書

図書
sponsored by the IEEE Electron Devices Society
出版情報: Piscataway : IEEE Service Center, c1996  xi, 313 p. ; 28 cm
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7.

図書

図書
edited by Soon Huat Ong, MK Radhakrishnan ; organised by, IEEE Singapore Section, Reliability/CPMT/EDS Chapter ; technical co-sponsorship, IEEE Electron Devices Society ; in co-operation with National University of Singapore, Centre for IC Failure Analysis and Reliability, Institute of Microelectronics, Singapore, [and] Magnetics Technology Centre, Singapore
出版情報: Piscataway, NJ : Institute of Electrical and Electronics Engineers, c1995  230 p. ; 30 cm
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8.

図書

図書
sponsored by the IEEE Electron Devices Society
出版情報: New York, NY : Institute of Electrical and Electronics Engineers, c1991  xii, 264 p. ; 28 cm
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9.

図書

図書
sponsored by the IEEE Electron Devices Society
出版情報: New York, NY : Institute of Electrical and Electronics Engineers, c1991  xi, 214 p. ; 28 cm
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10.

図書

図書
IEEE International Conference on Microelectronic Test Structures ; IEEE Electron Devices Society
出版情報: New York, N.Y. : Institute of Electrical and Electronics Engineers, c1989  xii, 265 p. ; 30 cm
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