| 1.
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図書
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sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section
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| 2.
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図書
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sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE
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| 3.
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図書
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presented by the Test Technology Committee, the International Test Formation [i.e. Foundation] ; sponsored by IEEE Computer Society, IEEE Philadelphia Section
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| 4.
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図書
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sponsored by IEEE Electron Devices Society
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| 5.
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図書
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sponsored by the IEEE Electron Devices Society
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| 6.
図書 |
図書
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[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]
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| 7.
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図書
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sponsored by the IEEE Computer Society Technical Committee on Test Technology, National Tsing Hua University
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| 8.
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図書
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sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]
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| 9.
図書 |
図書
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sponsored by IEEE Computer Society Test Technology Technical Committee, Computer Chapter of IEEE Singapore Section, Singapore Polytechnic ; in cooperation with National University of Singapore, Nanyang Technological University
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| 10.
図書 |
図書
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sponsored by the IEEE Electron Devices Society
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