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1.

図書
図書
1. 15th annual proceedings, reliability physics 1977 : Las Vegas, Nevada, April 12-14, 1977
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Group
出版情報: New York, NY : Electron Devices Society and reloability Group of the Institute of Electrical and Electronics Engineers, 1977  vi, 283, [3] p. ; 28 cm
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2.

図書
図書
2. 1999 IEEE International Reliability Physics Symposium proceedings : 37th annual, San Diego, California, March 23-25, 1999 (: soft. ; : case.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N. J. : Institute of Electrical and Electronics Engineers, c1999  vii, 448 p. ; 28 cm
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3.

図書
図書
3. 1997 IEEE International Reliability Physics Symposium proceedings : 35th annual, Denver, Colorado, April 8, 9, 10, 1997 (: soft. ; : case.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway : Institute of Electrical and Electronics Engineers, c1997  vi, 384 p. ; 28 cm
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4.

図書
図書
4. 1998 IEEE International Reliability Physics Symposium proceedings : 36th annual, Reno, Nevada, March 31, April 1, 2, 1998 (: soft. ; : case.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N. J. : Institute of Electrical and Electronics Engineers, c1998  vii, 421 p. ; 28 cm
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5.

図書
図書
5. 1996 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 1996
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataeay, N.J. : IEEE Service Center, c1997  175 p. ; 28 cm
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6.

図書
図書
6. IEEE 1994 International Integrated Reliability Workshop Final Report, Stanford Sierra Camp, Lake Tahoe, California, October 16-19, 1994
sponsored by IEEE Electron Devices Society and IEEE Reliability Society
出版情報: Piscataway, NJ : IEEE Service Center, c1994  v, 24, 155 p. ; 28 cm
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7.

図書
図書
7. 1995 IEEE International Reliability Physics Proceedings : 33rd annual, Las Vegas, Nevada, April 4, 5, 6, 1995 (: soft. ; : case. ; : micro.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway : Institute of Electrical and Electronics Engineers, c1995  vii, 405 p. ; 28 cm
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8.

図書
図書
8. 1996 IEEE International Reliability Physics Proceedings : 34th annual, Dallas, Texas, April 30, May 1, 2, 1996 (: soft. ; : case. ; : micro.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway : Institute of Electrical and Electronics Engineers, c1996  vi, 396 p. ; 28 cm
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9.

図書
図書
9. 1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataeay, N.J. : IEEE Service Center, c1996  vi, 172 p. ; 28 cm
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10.

雑誌
雑誌
10. IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society
Institute of Electrical and Electronics Engineers ; IEEE Electron Devices Society ; IEEE Reliability Society
出版情報: New York, N.Y. : Institute of Electrical and Electronics Engineers, c2001-  v.
巻次年月次: Vol. 1, no. 1 (Mar. 2001)-
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11.

図書
図書
11. 29th annual proceedings : Reliability Physics 1991, Las Vegas, Nevada, April 9, 10, 11, 1991 (: soft. ; : hard. ; : micro.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York : Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, c1991  viii, 367 p. ; 28 cm
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12.

図書
図書
12. 30th Annual Proceedings : Reliability Physics 1992, San Diego, California, March 31, April 1, 2, 1992 (: soft ; : case ; : micro)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York : Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, c1992  x, 404 p. ; 28 cm
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13.

雑誌
雑誌
13. IEEE transactions on semiconductor manufacturing : a publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society, the IEEE Solid-State Circuits Council
Institute of Electrical and Electronics Engineers
出版情報: New York, N.Y. : Institute of Electrical and Electronics Engineers, c1988-
巻次年月次: Vol. 1, no. 1 (Feb. 1988)-
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14.

図書
図書
14. 28th Annual Proceedings : Reliability Physics 1990, New Orleans, Louisiana, March 27,28,29, 1990
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York : Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, c1990  v, 322 p. ; 28 cm
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15.

図書
図書
15. 27th Annual Proceedings : Reliability Physics 1989, Phoenix, Arizona, April 11,12,13, 1989
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: [N.Y.?] : Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, c1989  v, 259 p. ; 28 cm
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16.

図書
図書
16. 1994 IEEE International Reliability Physics Proceedings : 32nd annual, San Jose, California, April 12, 13, 14, 1994 (: soft. ; : case. ; : micro.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability
出版情報: Piscataway : Institute of Electrical and Electronics Engineers, c1994  xi, 505 p. ; 28 cm
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17.

図書
図書
17. 31st Annual Proceedings : Reliability Physics 1993, Atlanta, Georgia, March 23, 24, 25, 1993 (: soft. ; : case. ; : micro.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York : Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, c1993  x, 411 p. ; 28 cm
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18.

図書
図書
18. 2002 IEEE International Reliability Physics Symposium proceedings : 40th annual, Dallas, Texas, April 7-11, 2002 (: soft.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2002  viii, 476 p. ; 28 cm
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19.

図書
図書
19. 2003 IEEE International Reliability Physics Symposium proceedings : 41st annual, Dallas, Texas, March 30-Apri 4, 2003 (: soft.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2002 , c2003  x, 645 p. ; 28 cm
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20.

図書
図書
20. 18th annual proceedings : Reliability Physics 1980, Las Vegas, Nevada, April 8-10, 1980
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York, N.Y. : Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, c1980  vii, 339 p. ; 28 cm
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21.

図書
図書
21. 19th annual proceedings : Reliability Physics 1981, Orlando, Florida, April 7-9, 1981
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York, N.Y. : Electron Device and Reliability Society of the Institute of Electrical and Electronics Engineers, c1981  vii, 310 p. ; 28 cm
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22.

図書
図書
22. 20th annual proceedings : Reliability Physics 1982, San Diego, California, March 30, 31, April, 1982
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York, N.Y. : Electron Device and Reliability Society of the Institute of Electrical and Electronics Engineers, c1982  vii, 324 p. ; 28 cm
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23.

図書
図書
23. 21st annual proceedings : Reliability Physics 1983, Phoenix, Arizona, April 5, 6, 7, 1983
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York, N.Y. : Electron Device and Reliability Society of the Institute of Electrical and Electronics Engineers, c1983  viii, 356 p. ; 28 cm
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24.

図書
図書
24. 22nd annual proceedings : Reliability Physics 1984, Las Vegas, Nevada, April 3, 4, 5, 1984
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York, N.Y. : Electron Device and Reliability Society of the Institute of Electrical and Electronics Engineers, c1984  viii, 309 p. ; 28 cm
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25.

図書
図書
25. 2001 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 15-18, 2001 (:softbound)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : IEEE Operations Center, c2001  v, 106 p. ; 28 cm
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26.

図書
図書
26. Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002
edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2002  258 p. ; 30 cm
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27.

図書
図書
27. 2001 IEEE International Reliability Physics Symposium proceedings : 39th annual, Orlando, Florida・April 30-May 3, 2001 (: soft.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2001  x, 464 p. ; 28 cm
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28.

図書
図書
28. 1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 (:softbound)
sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society
出版情報: Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society, c1997  vii, 161 p. ; 28 cm
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29.

図書
図書
29. 1998 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 12-15, 1998 (:softbound)
sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society
出版情報: Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society, c1998  vi, 140 p. ; 28 cm
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30.

図書
図書
30. 2000 IEEE International Reliability Physics Symposium proceedings : 38th annual, San Jose, California, April 10-13, 2000 (: soft. ; : case.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N. J. : Institute of Electrical and Electronics Engineers, c2000  viii, 455 p. ; 28 cm
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31.

図書
図書
31. 1999 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 18-21, 1999 (: softbound)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataeay, N.J. : IEEE Service Center, c1999  viii, 188 p. ; 28 cm
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32.

図書
図書
32. 2000 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 23-26, 2000 (: softbound)
sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society
出版情報: Piscataeay, N.J. : IEEE Operations Center, c2000  vii, 199 p. ; 28 cm
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33.

図書
図書
33. 2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society
出版情報: Piscataway, N.J. : IEEE Electron Devices Society : IEEE Reliability Society, c2005  vi, 182 p. ; 28 cm
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34.

図書
図書
34. 2004 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Conference Center, S. Lake Tahoe, California, October 18-21, 2004 (: softbound)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: [Piscataway, N.J.] : The Electron Devices Society and the Reliability Society of the Institute of Electrical and Electronics Engineers, c2004  vi, 222 p. ; 28 cm
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35.

図書
図書
35. 2005 IEEE International Reliability Physics Symposium proceedings : 43nd [i.e. 43rd] annual, San Jose, California, April 17-21, 2005 (: soft.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: [Piscataway, N.J.] : Institute of Electrical and Electronics Engineers, c2005  xii, 764 p. ; 28 cm
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36.

図書
図書
36. 2002 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002 (:softbound)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : IEEE Operations Center, c2002  v, 214 p. ; 28 cm
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37.

図書
図書
37. Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2003
edited by Philip HO ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore
出版情報: Piscataway, N.J. : IEEE Operations Center, c2003  216 p. ; 30 cm
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38.

図書
図書
38. 2003 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : IEEE Operations Center, c2003  viii, 182 p. ; 28 cm
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39.

図書
図書
39. 2004 IEEE International Reliability Physics Symposium proceedings : 42nd annual, Phoenix, Arizona, April 25-29, 2004 (: soft.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2002, c2004  xii, 748 p. ; 28 cm
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40.

図書
図書
40. 23rd annual proceedings : Reliability Physics 1985, Orland, Florida, March 26, 27, 28, 1985
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York, N.Y. : Electron Device and Reliability Societies of the Institute of Electrical and Electronics Engineers, c1985  viii, 252 p. ; 28 cm
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41.

図書
図書
41. 24th annual proceedings : Reliability Physics 1986, Anaheim, California, April 1, 2, 3
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York, N.Y. : Electron Device and Reliability Societies of the Institute of Electrical and Electronics Engineers, c1986  viii, 282 p. ; 28 cm
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42.

図書
図書
42. 25th annual proceedings : Reliability Physics 1987, San Diego, California, April 7, 8, 9, 1987
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York, N.Y. : Electron Device and Reliability Societies of the Institute of Electrical and Electronics Engineers, c1987  viii, 279 p. ; 28 cm
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43.

図書
図書
43. 26th annual proceedings : Reliability Physics 1988, Monterey, California, April 12, 13, 14, 1988
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: New York, N.Y. : Electron Device and Reliability Societies of the Institute of Electrical and Electronics Engineers, c1988  x, 255 p. ; 28 cm
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